Engineering topics

Aifer, E.

Publications and source records attributed to Aifer, E..

4 records

NASA NTRS1992

Arcing of negatively biased solar cells in a plasma environment. I - Experimental observations

A variety of experiments have been performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells operating in a low earth orbit plasma environment. These efforts have led to a reduction of greater than a factor of 100 in the arc frequency of a single cells following proper remeditation procedures. Experiments naturally led to and focused on the adhesive/encapsulating that is used to bond the protective cover slip to the solar cell. An image-intensified CCD camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude.

Upschulte, B. L.↗

NASA NTRS1992

Solar cell arcing: The role of outgassing and contamination

The effect of outgassing, venting, and thruster firing events on spacecraft system performance has been a long standing issue. Recent laboratory measurements on negatively biased high voltage solar cells at Physical Sciences Inc. (PSI) suggest that some currently designed and certainly future space power systems must address/re-evaluate this issue. Our observations show that exposing these cells to moderate levels (10 exp -3 torr-min) of H2O vapor enhances the arcing frequency, while heating to 85 C to remove water vapor significantly reduces the arc frequency. The interaction of the adhesive used to attach the cover glass to the solar cell with ambient water vapor is the key factor in determining arcing rates. Elimination of adhesive exposed to the environmental plasma reduces the arc frequency more than two orders of magnitude, and eliminates any sensitivity to H2O exposure. The adhesive may also become a source of spacecraft contamination. Macroscopic amounts were observed to blow off some arc events, and (we assume) electrostatically precipitate at other negatively biased locations. Data, analysis, and potential impact for future space platforms are discussed.

Marinelli, W. J.↗

NASA NTRS1992

Arcing of negatively biased solar cells in low earth orbit

A set of experiments is described in which the arcing of negatively biased solar cells is examined and characterized in terms of the primary factors that cause such behavior. The experiments are conducted in an ultrahigh vacuum chamber, and an image-intensified CCD camera is employed to monitor UV emission from arc events at the interfacial edge between the cover slip and the solar cell. A bead of encapsulant along the interfacial edge is noted which can be removed to reduce arc frequency, and water contamination is found to further enhance arcing. Frequency of arcing is found to vary indirectly with temperature and directly with exposure to H2O, but no other significant correlations are noted. The sensitivity to H2O vapor is eliminated by simply removing the adhesive/encapsulant, and the corresponding arc-rate performance is low.

Upschulte, B. L.↗

NASA NTRS1991

Significant reduction in arc frequency biased solar cells: Observations, diagnostics, and mitigation technique(s)

A variety of experiments were performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells. These efforts have led to reduction of greater than a factor of 100 in the arc frequency of a single cell following proper remediation procedures. Experiments naturally lead to and focussed on the adhesive/encapsulant that is used to bond the protective cover slip to the solar cell. An image-intensified charge coupled device (CCD) camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude. Water contamination was also identified as a key contributor which enhances arcing of the encapsulant bead along the solar cell edge. Spectrally resolved measurements of the observable UV light shows a feature assignable to OH(A-X) electronic emission, which is common for water contaminated discharges. Experiments in which the solar cell temperature was raised to 85 C showed a reduced arcing frequency, suggesting desorption of H2O. Exposing the solar cell to water vapor was shown to increase the arcing frequency. Clean dry gases such as O2, N2, and Ar show no enhancement of the arcing rate. Elimination of the exposed encapsulant eliminates any measurable sensitivity to H2O vapor.

Upschulte, B. L.↗