Engineering topics

Al-Assadi, Waleed K.

Publications and source records attributed to Al-Assadi, Waleed K..

2 records

NASA NTRS1993

Faulty behavior of asynchronous storage elements

It is often assumed that the faults in storage elements (SE's) can be modeled as output/input stuck-at-faults of the element. They are implicitly considered equivalent to the stuck-at faults in the combinational logic surrounding the SE cells. A more accurate higher level fault model for elementary SE's used in asynchronous circuits is presented. This model offers better representation of the physical failures. It is shown that the stuck-at model may be adequate if only modest fault coverage is desired. The enhanced model includes some common fault behaviors of SE's that are not covered by the stuck-at model. These include data-feed-through behaviors that cause the SE to be combinational. Fault models for complex SE cells can be obtained without a significant loss of information about the structure of the circuit.

Al-Assadi, Waleed K.↗

NASA NTRS1992

Detection of feed-through faults in CMOS storage elements

In testing sequential circuits, internal faults in the storage elements (SE's) are sometimes modeled as stuck-at faults in the combinational circuits surrounding the SE. The detection of some transistor-level faults that cannot be modeled as stuck-at are considered. These feed-through faults cause the cell to become either data-feed-through, which makes the cell combinational, or clock-feed-through, which causes the clock signal or its complement to appear at the output. Under such faults, the cell does not function as a memory element. Here it is shown that such faults may or may not be detected depending on delays involved. Conditions under which race-ahead occurs are identified.

Al-Assadi, Waleed K.↗