Michoud Assembly Facility (MAF), 'Spray in Air' Overview
A general overview of the Michoud Assembly Facility Spray in Air processing is presented. The possible areas of Spray in Air Processing at the Michoud Assembly Facility are also identified.
Engineering topics
Publications and source records attributed to Albyn, Keith.
A general overview of the Michoud Assembly Facility Spray in Air processing is presented. The possible areas of Spray in Air Processing at the Michoud Assembly Facility are also identified.
Computer models that predict the rate at which molecular contamination will deposit on optical surfaces typically use outgassing source terms, measured with quartz crystal microbalances, as a basis for the prediction. The American Society of Testing and Materials, Standard Test Method for Contamination Outgassing Characteristics of Spacecraft Materials (Method E-1559), is probably the best know technique used by the aerospace community to measure the outgassing rates or source terms of materials. A simple method for the insitu calibration of quartz crystal microbalances, based on the heat of enthalphy of Adipic Acid, has been developed and demonstrated by the Marshall Space Flight Center, Environmental Effects Group. The calibration has been demonstrated over a sample temperature range of 25 to 66 degrees Celsius and deposition rates of 7 x 10 (exp -11) grams/cm(sup 2)-s and greater, for several measurement system configurations. This calibration technique is fully compatible with the American Society for Testing and Materials, Method E-1559, as well as other methodology. The calibration requires no modification of outgassing facilities employing an effusion cell and does not degrade the performance or function of typical vacuum systems.
Recent quartz crystal microbalance measurements made in the Marshall Space Flight Center, Photo-Deposition Facility, for several materials, recorded a significant loss of deposited contaminants when the deposition surface of the microbalance was illuminated by a deuterium lamp. These measurements differ from observations made by other investigators in which the rate of deposition increased significantly when the deposition surface was illuminated with vacuum ultraviolet radiation. These observations suggest that the accelerated deposition of molecular contaminants on optically sensitive surfaces is dependant upon the contaminant being deposited and must be addressed during the materials selection process by common material screening techniques.
The International Space Station (ISS) solar arrays utilize MD-944 diode tape to protect the underlying diodes in the solar array panel circuit and also provide thermal conditioning and mechanical support. The diode tape consists of silicone pressure sensitive adhesive (Dow Coming QC-7725) with a protective Kapton over-layer. On-orbit, the Kapton over-layer will erode under exposure to atomic oxygen (AO) and the underlying exposed silicone adhesive will ultimately convert, under additional AO exposure, to a glass like silicate. The current operational plan is to retract ISS solar array P6 and leave it stored under load for a long duration (6 months or more) during ISS assembly. With the Kapton over-layer eroded away, the exposed silicone adhesive must not cause the solar array to stick to itself or cause the solar array to fail during redeployment. Previous testing by Lockheed-Martin Space Systems (LMSS) characterized silicone blocking following exposure to low energy atomic oxygen (AO) in an asher facility, but this is believed to be conservative. An additional series of tests was performed by the Environmental Effects Group at MSFC under direction from the ISS Program Office Environments Team. This test series included high energy AO (5 eV), near ultraviolet (NUV) radiation and ionizing radiation, singly and in combination. Additional samples were exposed to thermal energy AO (<0.1 ev) for comparison to the LMSS tests. Diode tape samples were exposed to each environment constituent individually, put under preload for seven days and then the resulting blocking force was measured using a tensile machine. Additional samples were exposed to AO, NUV and electrons in series and then put under long term (three to ten months) preload to determine the effect of preload duration on the resulting blocking force of the silicone-to-silicone bond. Test results indicate that high energy AO, ultraviolet radiation and electron ionizing radiation exposure all reduce the blocking force for a silicone-to-silicone bond. AO exposure produces the most significant reduction in blocking force.
The photolysis of three organic materials, by vacuum ultraviolet (VUV) radiation, has been quantified using 15-MHz temperature-controlled quartz microbalances (TQCM's). The rate at which molecular species, released from the individual samples, condensed on two TQCM s was measured for periods of up to 139.9-hours. The individual samples were heated in an effusion cell and the emitted molecular species collected on a pair of TQCM's which were maintained at -40 degrees Celsius. At several points during the deposition measurement, the deposition surface of one TQCM was illuminated by a 30 Watt deuterium lamp, and the loss of material from that surface was observed. V W illumination of the TQCM, concurrent with condensation, reduced the rate that material was lost from the deposition surface. These measurements present a contrasting picture of molecular deposition, in the presence of VUV, to that presented by other investigators who observed an enhanced rate of molecular deposition, when the deposition surface was illuminated by VUV.
Manned spacecraft have historically dumped the crew generated waste waster overboard, into the environment in which the spacecraft operates, sometimes depositing the waste water on the external spacecraft surfaces. The change in optical properties of wastewater deposited on spacecraft external surfaces, from exposure to space environmental effects, is not well understood. This study used nonvolatile residue (NVR) from Human Urine to simulate wastewater deposits and documents the changes in the optical properties of the NVR deposits after exposure to ultra violet (UV) radiation. Twenty NVR samples of, 0-angstromes/sq cm to 1000-angstromes/sq cm, and one sample contaminated with 1 to 2-mg/sq cm were exposed to UV radiation over the course of approximately 6151 equivalent sun hours (ESH). Random changes in sample mass, NVR, solar absorbance, and infrared emission were observed during the study. Significant changes in the UV transmittance were observed for one sample contaminated at the mg/sq cm level.
Manned spacecraft have historically dumped the crew generated waste water overboard, into the environment in which the spacecraft operates, sometimes depositing the waste water on the external spacecraft surfaces. The change in optical properties of wastewater deposited on spacecraft external surfaces, from exposure to space environmental effects, is not well understood. This study used nonvolatile residue (NVR) from Human Urine to simulate wastewater deposits and documents the changes in the optical properties of the NVR deposits after exposure to ultra violet(UV)radiation. Twenty four NVR samples of, 0-angstromes/sq cm to 1000-angstromes/sq cm, and one sample contaminated with 1 to 2-mg/sq cm were exposed to UV radiation over the course of approximately 6151 equivalent sun hours (ESH). Random changes in sample mass, NVR, solar absorbance, and infrared emission were observed during the study. Significant changes in the UV transmittance were observed for one sample contaminated at the mg/sq cm level.
The Materials Contamination Team at the Marshall Space Flight Center (MSFC) has been recognized for its contributions supporting the National Aeronautics and Space Administration (NASA) spacecraft development programs. These programs include the Reusable Solid Rocket Motor (RSRM), Chandra X-Ray Observatory, and the International Space Station (ISS). The Environmental Effects Group, with the Materials Contamination Team and the Space Environmental Effects Team has been an integral part of NASA's success by the testing, evaluation, and qualification of materials, hardware, and processes. This paper focuses on the capabilities of the Materials Contamination Team. The Materials Contamination Team's realm of responsibility includes establishing contamination control during all phases of hardware development, including design, manufacturing, assembly, test, transportation, launch site processing, on-orbit exposure, return, and refurbishment. The team continues its mission of reducing the risk of equipment failure due to molecular or particulate contamination. Contamination is a concern in the Space Shuttle with sensitive bond-lines and reactive fluid (liquid oxygen) compatibility as well as for spacecraft with sensitive optics, such as Hubble Space Telescope and Chandra X-ray Observatory. The Materials Contamination Team has a variety of facilities and instrumentation capable of contaminant detection, identification, and monitoring. The team addresses material applications dealing with environments, including production facilities, clean rooms, and on-orbit exposure. The optically stimulated electron emission (OSEE) system, the Ultraviolet (UV) fluorescence (UVF) surface contamination detection, and the Surface Optics Corporation 400 (SOC 400) portable hand-held Fourier Transform Infrared (FTIR) spectrometer are state-of-the-art tools for in-process molecular contamination detection. The team of engineers and technicians also develop contamination calibration standards and evaluate new surface cleanliness inspection technologies. The team utilizes facilities for on-orbit simulation testing of materials for outgassing and molecular film deposition characteristics in the presence of space environmental effects, such as Atomic Oxygen (AO) and UV radiation exposure. The Materials Contamination Team maintains databases for process materials as well as outgassing and optical compatibility test results for specific environments.
A solar array segment was recently removed from the Mir core module and returned for ground-based analysis. The segment, which is similar to the ones the Russians have provided for the FGB and Service Modules, was microscopically examined and disassembled by US and Russian science teams. Laboratory analyses have shown the segment to he heavily contaminated by an organic silicone coating, which was converted to an organic silicate film by reactions with atomic oxygen within the. orbital flight environment. The source of the contaminant was a silicone polymer used by the Russians as an adhesive and bonding agent during segment construction. During its life cycle, the array experienced a reduction in power performance from approx. 12%, when it was new and first deployed, to approx. 5%, when it was taken out of service. However, current-voltage measurements of three contaminated cells and three pristine, Russian standard cells have shown that very little degradation in solar array performance was due to the silicate contaminants on the solar cell surfaces. The primary sources of performance degradation is attributed to "thermal hot-spotting" or electrical arcing; orbital debris and micrometeoroid impacts; and possibly to the degradation of the solar cells and interconnects caused by radiation damage from high energy protons and electrons.
The use of thermal atom (kinetic energy near 0.04 eV) test methods as a materials selection and screening technique for LEO spacecraft is critically evaluated in this paper. The physics and chemistry of the thermal atom environments are shown to produce specific mass loss rates (mg/sq cm per min) and reaction efficiencies (Re) radically different from those produced in the LEO environment. A response surface study shows that specific mass loss rates change rapidly with plasma-asher parameters and seldom agree with flight data. FEP Teflon is shown to react by a different mechanism than Kapton, polyethylene, or graphite. The Re (Re = volume of material removed/oxygen atom) of Kapton, polyethylene, Mylar, Tedlar, FEP Teflon, and graphite measured in a flowing afterglow apparatus are 0.001 to 0.0001 those measured with high-energy atoms (kinetic energy 1.5 eV or greater) in beam systems or in LEO. The effect of sample temperature and atom impact energy on Re is discussed. A simple kinetic model describing the reaction of atomic oxygen with polymer surfaces is developed. Guidelines and recommendations for thermal atom testing and interpretation of test results are presented.
Experimental results are presented which indicate that low fluxes of vacuum UV (VUV) radiation exert a pronounced influence on the atomic oxygen reactivity of such fluorocarbon and fluorocarbon spacecraft materials as the FEP Teflon and PCTFE that are under consideration for the Space Station Freedom. With simultaneous exposure to VUV fluxes comparable to those experienced in LEO, the reactivity of these materials becomes comparable to that of Kapton; VUV radiation has also been shown to increase the reactivity of Kapton with thermal-energy oxygen atoms.