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Alley, R.

Publications and source records attributed to Alley, R..

EOS ASTER thermal infrared band vicarious calibration

Calibration of the 5 EOS ASTER instrument emission bands (90 m pixels at surface) is being checked during the operational life of the mission using field measurements simultaneous with the image acquisition.

EOS ASTER thermal infrared calibration

Algorithm Theoretical Basis Document for: Brightness Temperature

The Advanced Spaceborne Thermal Emission and Reflectance Radiometer (ASTER) is a high-spatial-resolution multispectral imaging device scheduled to fly in Earth orbit starting in mid-1999, on the first platform of NASA's Earth Observing System (EOS-AM 1.

ASTER thermal infrared temperature algorithm D-139

ASTER Validation Plan

This document is the validation plan for the ASTER standard data products.

ASTER validator calibration algorithm

What are the best radar wavelengths, incidence angles and polarizations for geologic applications? A statistical approach

Linear discriminant analysis of multifrequency and multipolarization radar scatterometer data of lava flows and sedimentary rocks indicates that the lava flows can be separated by age and the sedimentary rocks can be discriminated from one another. The optimum wavelengths, polarizations and incidence angles among those available for these problems was determined by the discriminant analysis program. For separation of the lava flows, shorter wavelengths, smaller incidence angles and horizontal polarization are best. A SIR-C radar configuration could provide nearly complete discrimination of these lava flows. Conversely, the longer wavelengths, larger incidence angles and vertical polarization was preferred for sedimentary rocks, perhaps due to the slight vegetation cover. Satisfactory classification of sedimentary rocks requires more radar data than for the lavas. These results are potentially useful both for radar system configuration and for geological applications. The method developed here may provide a rationale for user specification of imaging system parameters.

Blom, R.