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Andrews, James H.

Publications and source records attributed to Andrews, James H..

Random Test Run Length and Effectiveness

A poorly understood but important factor in many applications of random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear whether executing a small number of long runs or a large number of short runs maximizes utility. It is generally expected that longer runs are more likely to expose failures -- which is certainly true with respect to runs shorter than the shortest failing trace. However, longer runs produce longer failing traces, requiring more effort from humans in debugging or more resources for automated minimization. In testing with feedback, increasing ranges for parameters may also cause the probability of failure to decrease in longer runs. We show that the choice of test length dramatically impacts the effectiveness of random testing, and that the patterns observed in simple models and predicted by analysis are useful in understanding effects observed.

software testing

Application of Phase Shifted, Laser Feedback Interferometry to Fluid Physics

We have combined the principles of phase-shifting interferometry (PSI) and laser-feedback interferometry (LFI) to produce a new instrument that can measure both optical path length (OPL) changes and discern sample reflectivity variations. In LFI, coherent feedback of the incident light either reflected directly from a surface or reflected after transmission through a region of interest will modulate the output intensity of the laser. LFI can yield a high signal-to-noise ratio even for low reflectivity samples. By combining PSI and LFI, we have produced a robust instrument, based upon a HeNe laser, with high dynamic range that can be used to measure either static (dc) or oscillatory changes along the optical path. As with other forms of interferometry, large changes in OPL require phase unwrapping. Conversely, small phase changes are limited by the fraction of a fringe that can be measured. We introduce the phase shifts with an electro-optic modulator (EOM) and use either the Carre or Hariharan algorithms to determine the phase and visibility. We have determined the accuracy and precision of our technique by measuring both the bending of a cantilevered piezoelectric bimorph and linear ramps to the EOM. Using PSI, sub-nanometer displacements can be measured. We have combined our interferometer with a commercial microscope and scanning piezoelectric stage and have measured the variation in OPL and visibility for drops of PDMS (silicone oil) on coated single crystal silicon. Our measurement of the static contact angle agrees with the value of 68 deg stated in the literature.

Ovryn, Ben