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Asha Rani

Publications and source records attributed to Asha Rani.

Microcalorimeter Absorber Optimization for 0.2 to 12 keV X-Rays

The Advanced Telescope for High ENergy Astrophysics (ATHENA) mission requires high quantum efficiency (QE) x-ray absorption, >90.6% at 7 keV and low specific heat capacity, 0.731 pJ/K. The designed ATHENA x-ray absorbers are cantilevered square tiles (pitch of 317 microns) of 1.05 μm thick Au and 5.51 μm thick Bi electroplated films supported by stems that connect the absorber to the detector below. We discuss some of the methods used to produce x-ray absorbers meeting these specifications for ATHENA. To tune the thermal conductance of the device and the effect on the normal-to superconducting transition shape, the stems need to be small diameter and can have a weak bottle-neck connection to the substrate. A funnel shape of the stem using a proximity exposed photoresist mold has been developed to improve the strength of the connections. Further requirements on the absorbers include low levels of fine particulate remaining on the substrate after production and zero shorts between absorbers due to incomplete ion milling or trapped fine particular between absorbers. To optimize for post patterning substrate cleanliness and absorber yield, we have examined several methods of absorber fabrication. Three such methods are 1) an ion mill/wet etch combination, 2) a photoresist mold for electroplating followed by wet or dry etch to remove the seed layer, and 3) an electroplating process with leveling to smooth the surface followed by ion mill to separate the absorbers. The different combinations of wet and dry etches lead to different yields and surface appearance of the absorber sidewalls. We present results on the achieved pixel yields and the energy resolution of pixels made with the various fabrication methods. We discuss the impact of absorber patterning method on performance, uniformity, and yield.

Edward J Wassell↗

Development of a Transition-Edge Sensor Anti-Coincidence Detector for a Probe Class Mission

The Light Element Mapper (LEM), a probe class mission proposal slated for submission in 2023, combines a large X-ray optic with an extremely large format microcalorimeter array to probe the physics of galaxy formation with a grasp 22x greater than ATHENA and 7x greater than Lynx. The focal plane for LEM requires a larger anti-coincidence detector than the other missions while maintaining or exceeding their high-speed response, presenting a challenge for claiming technical readiness at the time of the announcement of opportunity (AO). We will perform a rapid demonstration in the next year including design, fabrication and integration and test of a high-fidelity transition-edge sensor (TES) based device at a scale suitable for LEM.

James Chervenak↗

Qualification of A Transition Edge Sensor Based Anti-Coincidence Detector for A Probe Class Mission

The Line Emission Mapper (or LEM) is an X-ray probe class mission aimed to study the physics of galaxy formation, with a large field-of-view, high-resolution transition-edge sensor (TES) microcalorimeter. Because of the diffuse and faint nature of LEM’s targets, a high-fidelity anticoincidence detector (anti-co) is essential to reduce instrument background below the level of sky background. Lying directly behind the LEM sensor, the anti-co will detect ~3 counts per second per square centimeter from background galactic cosmic rays and the secondary particles they induce to detect and flag any events that could be confused with a science photon in the 0.3-2 keV signal band of LEM. Our design spans an active region 4-cm in diameter. It consists of 12 quasiparticle-trap-assisted electrothermal-feedback (QET) channels, each with 100 parallel TESes with common bias lines. The TES is a narrow strip of Mo/Au bilayer. We present fabrication processes that maintain the transition temperature (T c ) in Mo/Au bilayer structures across the active region. We further present a new design based on a a-Si/W TES layer that has previously achieved reasonable uniformity in lab testing.

x-ray↗