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Baker, Michael Sean

Publications and source records attributed to Baker, Michael Sean.

Ultra-Thin, Temperature Stable, Low Power Frequency References

We have developed a MEMS based thin (<100 μm), temperature stable (< 1 parts-per-billion per degree Celsius (ppb/°C)), low power (<10 mW), frequency reference. Traditional high stability oscillators are based on quartz crystals. While a mature technology, the large size of quartz crystals presents important mission barriers including reducing oscillator thickness below 400 μm, and low power temperature stabilization (ovenizing). The small volume microresonators are 2 μm thick compared to 100’s of microns for quartz, and provide acoustic/thermal isolation when suspended above the substrate by narrow beams. This isolation enables a new paradigm for ovenizing oscillators at revolutionary low power levels <10 mW as compared to >300 mW for oven controlled quartz oscillators (OCXO). The oven controlled MEMS oscillator (OCMO) takes advantage of high thermal isolation and CMOS integration to ovenize the entire oscillator (AlN resonator and CMOS) on a suspended platform. This enables orders of magnitude reductions in size and power as compared with today's OCXO technology.

36 MATERIALS SCIENCE↗

Capacitor discharge pulse analysis.

Capacitors used in firing sets and other high discharge current applications are discharge tested to verify performance of the capacitor against the application requirements. Parameters such as capacitance, inductance, rise time, pulse width, peak current and current reversal must be verified to ensure that the capacitor will meet the application needs. This report summarizes an analysis performed on the discharge current data to extract these parameters by fitting a second-order system model to the discharge data and using this fit to determine the resulting performance metrics. Details of the theory and implementation are presented. Using the best-fit second-order system model to extract these metrics results in less sensitivity to noise in the measured data and allows for direct extraction of the total series resistance, inductance, and capacitance.

Baker, Michael Sean↗