A microprocessor-based one dimensional optical data processor for spatial frequency analysis
A high degree of accuracy was obtained in measuring the spatial frequency spectrum of known samples using an optical data processor based on a microprocessor, which reliably collected intensity versus angle data. Stray light control, system alignment, and angle measurement problems were addressed and solved. The capabilities of the instrument were extended by the addition of appropriate optics to allow the use of different wavelengths of laser radiation and by increasing the travel limits of the rotating arm to + or - 160 degrees. The acquisition, storage, and plotting of data by the computer permits the researcher a free hand in data manipulation such as subtracting background scattering from a diffraction pattern. Tests conducted to verify the operation of the processor using a 25 mm diameter pinhole, a 39.37 line pairs per mm series of multiple slits, and a microscope slide coated with 1.091 mm diameter polystyrene latex spheres are described.