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Banks, B.

Publications and source records attributed to Banks, B..

11 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1990

Vacuum ultraviolet radiation and thermal cycling effects on atomic oxygen protective photovoltaic array blanket materials

The importance of synergistic environmental exposure is demonstrated through the evaluation of DuPont 93-1 in simulated LEO environment. Changes in optical properties, surface condition, and mass loss data are described. The qualitative results indicate the necessity for exposure of materials to a series of simulated LEO environments in order to properly determine synergistic effects and demonstrate the overall LEO durability of candidate materials. It is shown that synergistic effects may occur with vacuum thermal cycling combined with VUV radiation followed by atomic oxygen exposure. Testing the durability of candidate solar array blanket materials in a test sequence with necessary synergistic effects makes it possible to determine the appropriate material for providing structural support and maintaining the proper operating temperature for solar cells in the SSF Photovaltaic Power System.

Brady, J.↗
NASA NTRS1988

Hubble Space Telescope Metallized Teflon(registered trademark) FEP Thermal Control Materials: On-Orbit Degradation and Post-Retrieval Analysis

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon(Registered Trademark) FEP (fluorinated ethylene propylene), used as the outer layer of the multilayer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon(Registered Trademark) FEP sample evaluation and additional testing of pristine Teflon(Registered Trademark) FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations , and that the damage increased with the combined total dose of electrons, protons, UV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the retrieved Teflon(Registered Trademark) FEP.

Townsend, Jacqueline A.↗
NASA NTRS1984

Definition of ground test for verification of large space structure control

Control theory and design, dynamic system modelling, and simulation of test scenarios are the main ideas discussed. The overall effort is the achievement at Marshall Space Flight Center of a successful ground test experiment of a large space structure. A simplified planar model of ground test experiment of a large space structure. A simplified planar model of ground test verification was developed. The elimination from that model of the uncontrollable rigid body modes was also examined. Also studied was the hardware/software of computation speed.

Doane, G. B., III↗
NASA NTRS1984

Optical and interfacial electronic properties of diamond-like carbon films

Hard, semitransparent carbon films were prepared on oriented polished crystal wafers of silicon, indium phosphide and gallium arsenide, as well as on KBr and quartz. Properties of the films were determined using IR and visible absorption spectrocopy, ellipsometry, conductance-capacitance spectroscopy and alpha particle-proton recoil spectroscopy. Preparation techniques include RF plasma decomposition of methane (and other hydrocarbons), ion beam sputtering, and dual-ion-beam sputter deposition. Optical energy band gaps as large as 2.7 eV and extinction coefficients lower than 0.1 at long wavelengths are found. Electronic state densities at the interface with silicon as low as 10 to the 10th states/eV sq cm per were found.

Woollam, J. A.↗
NASA NTRS1983

Interfacial electrical properties of ion-beam sputter deposited amorphous carbon on silicon

Amorphous, 'diamond-like' carbon films have been deposited on Si substrates, using ion-beam sputtering. The interfacial properties are studied using capacitance and conductance measurements. Data are analyzed using existing theories for interfacial electrical properties. The density of electronic states at the interface, along with corresponding time constants are determined.

Khan, A. A.↗
NASA NTRS1981

Simultaneous ion sputter polishing and deposition

Results of experiments to study ion beam sputter polishing in conjunction with simultaneous deposition as a mean of polishing copper surfaces are presented. Two types of simultaneous ion sputter polishing and deposition were used in these experiments. The first type utilized sputter polishing simultaneous with vapor deposition, and the second type utilized sputter polishing simultaneous with sputter deposition. The etch and deposition rates of both techniques were studied, as well as the surface morphology and surface roughness.

Rutledge, S.↗
NASA NTRS1975

Direct thrust measurement of a 30-cm ion thruster

A direct thrust measurement of a 30-cm diameter ion thruster was accomplished by means of a laser interferometer thrust stand. The thruster was supported in a pendulum manner by three 3.65-m long wires. Electrical power was provided by means of 18 mercury filled pots. A movable 23-button planar probe rake was used to determine thrust loss due to ion beam divergence. Values of thrust, thrust loss due to ion beam divergence, and thrust loss due to multiple ionization were measured for ion beam currents ranging from 0.5 to 2.5 A. Measured thrust values indicate an accuracy of approximately 1% and are in good agreement with thrust values calculated by indirect measurements.

Banks, B.↗
NASA NTRS1975

Direct thrust measurement of a 30-cm ion thruster

A direct thrust measurement of a 30-cm diameter ion thruster was accomplished by means of a laser interferometer thrust stand. The thruster was supported in a pendulum manner by three 3.65-m long wires. Electrical power was provided by means of 18 mercury filled pots. A movable 23-button planar probe rake was used to determine thrust loss due to ion beam divergence. Values of thrust, thrust loss due to ion beam divergence, and thrust loss due to multiple ionization were measured for ion beam currents ranging from 0.5 A to 2.5 A. Measured thrust values indicate an accuracy of approximately 1% and are in good agreement with thrust values calculated by indirect measurements.

Banks, B.↗
NASA NTRS1968

Reducing bubbles in glass coatings improves electrical breakdown strength

Helium reduces bubbles in glass coatings of accelerator grids for ion thrustors. Fusing the coating in a helium atmosphere creates helium bubbles in the glass. In an argon atmosphere, entrapped helium diffuses out of the glass and the bubbles collapse. The resultant coating has a substantially enhanced electrical breakdown strength.

Banks, B.↗
NASA NTRS1968

Composite ion accelerator grids.

Ion extraction system for low voltage mercury electron bombardment thrustors using glass coating fused to perforated metal grid

Banks, B.↗