Engineering topics

Barber, S K

Publications and source records attributed to Barber, S K.

3 records

DOE OSTI2025

Greater than 1000-fold Gain in a Free-Electron Laser Driven by a Laser-Plasma Accelerator with High Reliability

Compact free-electron lasers (FELs) based on plasma-based accelerators have been envisioned for many years. While recent milestone experiments have demonstrated feasibility, further progress is needed to establish laser-plasma-accelerator-driven FELs as reliable light sources. Demonstrating both full FEL saturation and reliable operation commensurate with conventional FEL facilities is critical. We report progress on both of these fronts. FEL gain exceeding 1000 at a wavelength of 420 nm in the self-amplified spontaneous emission regime has been measured. Lower and upper bounds for the characteristic exponential gain length were measured at 16.7-22.5 cm. Additionally, reliability of the laser-plasma-accelerator-driven FEL, defined here as the percentage of shots displaying FEL gain, reached an unprecedented level of greater than 90% over the course of an hour while operating at 1 Hz repetition rate.

Barber, S K↗

DOE OSTI2011

Calibration of the Modulation Transfer Function of Surface Profilometers with Binary Pseudorandom Test Standards: Expanding the Application Range to Fizeau Interferometers and Electron Microscopes

A modulation transfer function (MTF) calibration method based on binary pseudorandom (BPR) gratings and arrays has been proven to be an effective MTF calibration method for interferometric microscopes and a scatterometer. Here we report on a further expansion of the application range of the method. We describe the MTF calibration of a 6 in. phase shifting Fizeau interferometer. Beyond providing a direct measurement of the interferometer's MTF, tests with a BPR array surface have revealed an asymmetry in the instrument's data processing algorithm that fundamentally limits its bandwidth. Moreover, the tests have illustrated the effects of the instrument's detrending and filtering procedures on power spectral density measurements. The details of the development of a BPR test sample suitable for calibration of scanning and transmission electron microscopes are also presented. Such a test sample is realized as a multilayer structure with the layer thicknesses of two materials corresponding to the BPR sequence. The investigations confirm the universal character of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2010

Characterization of electron microscopes with binary pseudo-random multilayer test samples

Verification of the reliability of metrology data from high quality X-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binarypseudo-random (BPR) gratings and arrays has been suggested and and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer. Here we describe the details of development of binarypseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi{sub 2}/Si multilayer coating with pseudo-randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML testsamples can be used to characterize X-ray microscopes. Corresponding work with X-ray microscopes is in progress.

36 MATERIALS SCIENCE↗