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Bavuso, S. J.

Publications and source records attributed to Bavuso, S. J..

14 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1986

Interface Program for Reliability Predictions

CARE3MENU generates input file for CARE III program. Used to predict reliabilities of complex, redundant, fault-tolerant systems, including digital computers, aircraft, and nuclear and chemical control systems. CARE III input file often becomes complicated and not easily formatted with text editor. Provides easy interactive method of creating input file by automatically formatting set of user-supplied inputs for CARE III system. CARE3MENU provides detailed online help for most of its screen formats.

Bavuso, S. J.↗
NASA NTRS1986

Computer-Aided Reliability Estimation

CARE III (Computer-Aided Reliability Estimation, Third Generation) helps estimate reliability of complex, redundant, fault-tolerant systems. Program specifically designed for evaluation of fault-tolerant avionics systems. However, CARE III general enough for use in evaluation of other systems as well.

Bavuso, S. J.↗
NASA NTRS1985

Care 3 model overview and user's guide, first revision

A manual was written to introduce the CARE III (Computer-Aided Reliability Estimation) capability to reliability and design engineers who are interested in predicting the reliability of highly reliable fault-tolerant systems. It was also structured to serve as a quick-look reference manual for more experienced users. The guide covers CARE III modeling and reliability predictions for execution in the CDC CYber 170 series computers, DEC VAX-11/700 series computer, and most machines that compile ANSI Standard FORTRAN 77.

Bavuso, S. J.↗
NASA NTRS1984

Reliability and maintainability assessment factors for reliable fault-tolerant systems

A long term goal of the NASA Langley Research Center is the development of a reliability assessment methodology of sufficient power to enable the credible comparison of the stochastic attributes of one ultrareliable system design against others. This methodology, developed over a 10 year period, is a combined analytic and simulative technique. An analytic component is the Computer Aided Reliability Estimation capability, third generation, or simply CARE III. A simulative component is the Gate Logic Software Simulator capability, or GLOSS. The numerous factors that potentially have a degrading effect on system reliability and the ways in which these factors that are peculiar to highly reliable fault tolerant systems are accounted for in credible reliability assessments. Also presented are the modeling difficulties that result from their inclusion and the ways in which CARE III and GLOSS mitigate the intractability of the heretofore unworkable mathematics.

Bavuso, S. J.↗
NASA NTRS1984

A user's view of CARE III

The present computerized reliability predictor for digital fault-tolerant systems whose sizes are of the order of one million Markovian equivalent states, employs advanced stochastic modeling techniques and implements a mixed Markov model that enables it to drastically reduce the state size of hitherto computationally unobtainable models. Attention is given to the concepts of failure, fault, and error, in the context of the novel system's fault/error-handling models. Examples are drawn from the system's user-friendly interface dialog.

Bavuso, S. J.↗
NASA NTRS1982

Advanced reliability modeling of fault-tolerant computer-based systems

Two methodologies for the reliability assessment of fault tolerant digital computer based systems are discussed. The computer-aided reliability estimation 3 (CARE 3) and gate logic software simulation (GLOSS) are assessment technologies that were developed to mitigate a serious weakness in the design and evaluation process of ultrareliable digital systems. The weak link is based on the unavailability of a sufficiently powerful modeling technique for comparing the stochastic attributes of one system against others. Some of the more interesting attributes are reliability, system survival, safety, and mission success.

Bavuso, S. J.↗
NASA NTRS1981

Methodology for measurement of fault latency in a digital avionic miniprocessor

Using a gate level emulation of a typical avionics miniprocessor, fault injection experiments were performed to (1) determine the time to detect a fault by comparison monitoring, (2) forecast a program's ability to detect faults and (3) validate the fault detection coverage of a typical self test program. To estimate time to detect, six programs ranging in complexity from 6 to 147 instructions, were emulated. Each program was executed repetitively in the presence of a single stuck at fault at a gate node or device pin. Detection was assumed to occur whenever the computed outputs differed from the corresponding outputs of the same program executed in a nonfaulted processor. Histograms of faults detected versus number of repetitions to detection were tabulated. Using a simple model of fault detection, which was based in an analog with the selection of balls in an urn, distributions of time to detect were computed and compared with those obtained empirically. A self test program of 2,000 executable instructions was designed expressly for the study. The only requirement imposed on the design was that it should achieve 95% coverage. The program was executed in the presence of a single stuck-at fault at a gate node on device pin. The proportion of detected faults are tabulated. In all experiments faults were selected at random over gate nodes or device pins.

Mcgough, J. C.↗
NASA NTRS1981

Methodology for measurement of fault latency in a digital avionic miniprocessor

Investigations regarding the synthesis of a reliability assessment capability for fault-tolerant computer-based systems have been conducted for several years. In 1978 a pilot study was conducted to test the feasibility of measuring detection coverage and investigating the dynamics of fault propagation in a digital computer. A description is presented of an investigation concerned with the applicability of previous results to a real avionics processor. The obtained results show that emulation is a practicable approach to failure modes and effects analysis of a digital processor. The run time of the emulated processor on a PDP-10 host computer is only 20,000 to 25,000 times slower than the actual processor. As a consequence large numbers of faults can be studied at relatively little cost and in a timely manner.

Mcgough, J. G.↗
NASA NTRS1979

Trends in reliability modeling technology for fault tolerant systems

Developments in reliability modeling for large fault tolerant avionic computing systems are presented. Issues of state size and complexity, fault coverage, and practical computation are addressed. A two-fold developmental effort is described based on the structural and fault coverage modeling approaches. A technique which was successfully applied to an 865 state pure death stationary Markov model is presented. Of particular interest is a short computer program which executes very quickly to produce reliability results of a large state space model. This model also incorporates fault coverage states for processor, memory, and bus line replaceable units. A second structural reliability modeling scheme is aimed at solving nonstationary Markov models. This technique provides the tool required for studying the reliability of systems with nonconstant failure rates and includes intermittent/transient faults, electronic hardware which exhibits decreasing failure rates, and hydromechanical devices which typically have wearout failure mechanisms. Several aspects of fault coverage, including modeling and data measurement of intermittent/transient faults and latent faults, are elucidated and illustrated. The CARE II (computer-aided reliability estimation) coverage is presented and shortcomings to be eliminated are discussed.

Bavuso, S. J.↗
NASA NTRS1979

Trends in reliability modeling technology for fault tolerant systems

Reliability modeling for fault tolerant avionic computing systems was developed. The modeling of large systems involving issues of state size and complexity, fault coverage, and practical computation was discussed. A novel technique which provides the tool for studying the reliability of systems with nonconstant failure rates is presented. The fault latency which may provide a method of obtaining vital latent fault data is measured.

Bavuso, S. J.↗
NASA NTRS1975

Automated statistical analysis program (ASAP)

Pattern recognition subprogram is used to produce table which indicates sections of input data. Program then uses data to write set of Kirchhoff equations algebraically solved by Gaus reduction method.

Bavuso, S. J.↗
NASA NTRS1975

Impact of coverage on the reliability of a fault tolerant computer

A mathematical reliability model is established for a reconfigurable fault tolerant avionic computer system utilizing state-of-the-art computers. System reliability is studied in light of the coverage probabilities associated with the first and second independent hardware failures. Coverage models are presented as a function of detection, isolation, and recovery probabilities. Upper and lower bonds are established for the coverage probabilities and the method for computing values for the coverage probabilities is investigated. Further, an architectural variation is proposed which is shown to enhance coverage.

Bavuso, S. J.↗
NASA NTRS1970

Man-machine interactive system simplifies computer-aided circuit design

Langley interactive computerized circuit analysis capability /LICCA/ enables designer to draw electronic circuit diagrams on cathode ray tube screen. This information is submitted as input to user-selected circuit analysis program. LICCA accommodates binary logic circuits and circuits with discrete components, and monitors operator's instructions to detect errors.

Bavuso, S. J.↗