Engineering topics

Beauvais, W. J.

Publications and source records attributed to Beauvais, W. J..

2 records

NASA NTRS1993

Microdensity in space using microelectronic circuits

Single event phenomena in biological organisms are compared with similar phenomena in microeletronic circuits and the similarities and differences are discussed. Both types of phenomena appear to obey the same model, at least to first order. The general applicability of this first-order model appears to reflect the need to operate despite the noise inherent in the storage and processing of information within microscopic volume elements. Arrays of p-n junctions, each having dimensions of a few microns, are proposed as solid state microdosimeters.

Mcnulty, P. J.↗

NASA NTRS1992

Charge collection at large angles of incidence

Charge collection exhibited by p-n junctions, which have at least one small dimension, deviates from the geometric assumptions commonly used in SEU (single event upset) testing. The amount of charge collected did not increase with the secant of the angle of incidence. The number of events under the peak in the charge collection spectrum did not decrease as the cosine of the angle of incidence. Both the position of the peak and the number of events under the peak measured at a given angle of incidence depended upon which symmetry axis of the device was chosen to be the axis of rotation.

Mcnulty, P. J.↗