Engineering topics

Becker-Reshef, I.

Publications and source records attributed to Becker-Reshef, I..

3 records

NASA NTRS2018

Remote Sensing Based Yield Monitoring: Application to Winter Wheat in United States and Ukraine

Accurate and timely crop yield forecasts are critical for making informed agricultural policies and investments, as well as increasing market efficiency and stability. Earth observation data from space can contribute to agricultural monitoring, including crop yield assessment and forecasting. In this study, we present a new crop yield model based on the Difference Vegetation Index (DVI) extracted from Moderate Resolution Imaging Spectroradiometer (MODIS) data at 1 km resolution and the un-mixing of DVI at coarse resolution to a pure wheat signal (100 percent of wheat within the pixel). The model was applied to estimate the national and subnational winter wheat yield in the United States and Ukraine from 2001 to 2017. The model at the subnational level shows very good performance for both countries with a coefficient of determination higher than 0.7 and a root mean square error (RMSE) of lower than 0.6 t/ha (tonnes per hectare) (15-18 percent). At the national level for the United States (US) and Ukraine the model provides a strong coefficient of determination of 0.81 and 0.86, respectively, which demonstrates good performance at this scale. The model was also able to capture low winter wheat yields during years with extreme weather events, for example 2002 in US and 2003 in Ukraine. The RMSE of the model for the US at the national scale is 0.11 t/ha (3.7 percent) while for Ukraine it is 0.27 t/ha (8.4 percent).

DVI↗

NASA NTRS2018

Enhancing Remote Sensing Based Yield Forecasting: Application to Winter Wheat in United States

Accurate and timely crop yield forecasts are critical for making informed agricultural policies and investments, as well as increasing market efficiency and stability. In Becker-Reshef et al. (2010) and Franch et al. (2015) we developed an empirical generalized model for forecasting winter wheat yield. In this study we present a new model based on the extrapolation of the pure wheat signal (100 percent of wheat within the pixel) from MODIS (Moderate-resolution Imaging Spectroradiometer) data at 1-kilometer resolution and using the Difference Vegetation Index (DVI). The model has been applied to monitor the national and state level yield of winter wheat in the United States from 2001 to 2016.

Agriculture↗

NASA NTRS2016

Incorporating Yearly Derived Winter Wheat Maps Into Winter Wheat Yield Forecasting Model

Wheat is one of the most important cereal crops in the world. Timely and accurate forecast of wheat yield and production at global scale is vital in implementing food security policy. Becker-Reshef et al. (2010) developed a generalized empirical model for forecasting winter wheat production using remote sensing data and official statistics. This model was implemented using static wheat maps. In this paper, we analyze the impact of incorporating yearly wheat masks into the forecasting model. We propose a new approach of producing in season winter wheat maps exploiting satellite data and official statistics on crop area only. Validation on independent data showed that the proposed approach reached 6% to 23% of omission error and 10% to 16% of commission error when mapping winter wheat 2-3 months before harvest. In general, we found a limited impact of using yearly winter wheat masks over a static mask for the study regions.

MODIS↗