Supersymmetric Chiral Bosons
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Engineering topics
Publications and source records attributed to Bellucci, S..
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R&D activity on Cu photocathodes is under development at the SPARC_LAB test facility to fully characterize each stage of the photocathode “life” and to have a complete overview of the photoemission properties in high brightness photo-injectors. The nano(n)-machining process presented here consists in diamond milling, and blowing with dry nitrogen. This procedure reduces the roughness of the cathode surface and prevents surface contamination introduced by other techniques, such as polishing with diamond paste or the machining with oil. Both high roughness and surface contamination cause an increase of intrinsic emittance and consequently a reduction of the overall electron beam brightness. To quantify these effects, we have characterized the photocathode surface in terms of roughness measurement, and morphology and chemical composition analysis by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) techniques. The effects of n-machining on the electron beam quality have been also investigated through emittance measurements before and after the surface processing technique. Finally, we present preliminary emittance studies of yttrium thin film on Cu photocathodes.
We thoroughly investigate the possibility to absorb most (i.e., up to more than 90%) of the incident electro-magnetic radiations in thin multilayered PMMA/graphene structures, thus proposing the technical realization of a device with an operational frequency range in the millimeter-wave domain, i.e., 30 GHz–300 GHz. Our simulations demonstrate the concrete possibility to enhance the field absorption by means of a selective removal and proper micro-pattering within the graphene material, enabling a complete and efficient control of the graphene sheet conductance. This method is applied to design and engineer a class of devices, endowed with a wideband operation capability, showing almost no fluctuations throughout the whole range of mm-wave frequencies.