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Benedetti, L. R. (ORCID:0000000160502983)

Publications and source records attributed to Benedetti, L. R. (ORCID:0000000160502983).

Yield degradation mechanisms for two-shock capsules evaluated through simulations

An investigation of twenty two-shock campaign indirectly driven capsules on the National Ignition Facility was conducted using the xRAGE computer code. The two-shock platform was developed to look at the sensitivity of fuel–ablator mix with shock timing, asymmetry, surface roughness, and convergence on roughly ignition size scale capsules. This platform used CH/CD (plastic/deuterated plastic) shell capsules that were about 685-μm outer radius and filled with D2 or hydrogen-tritium (HT) gas. The experimental radius and velocity vs time, neutron yield, burn averaged ion temperature (Tion), burn width, and self-emission image size were compared to one-dimensional (1D) and two-dimensional (2D) simulations. Our 2D simulations suggest that the mixing of glass from the fill tube was the dominant source of impurity in the gas region of the capsule during burn, along with fuel–ablator mix. The mass of glass mixed in is about 5–10 ng. Our 2D simulations capture most of the yield trends from different degradation mechanisms, and they match the observed burn width and Tion measurements. Our 2D models match all the available data to within 2.5 times the normalized experimental error for 19 of 20 capsules.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Long duration x-ray source development for x-ray diffraction at the National Ignition Facility

We present the results of experiments to produce a 10 ns-long, quasi-monochromatic x-ray source. This effort is needed to support time-resolved x-ray diffraction (XRDt) measurements of phase transitions during laser-driven dynamic compression experiments at the National Ignition Facility. To record XRDt of phase transitions as they occur, we use high-speed (∼1 ns) gated hybrid CMOS detectors, which record multiple frames of data over a timescale of a few to tens of ns. Consequently, to make effective use of these imagers, XRDt needs the x-ray source to be narrow in energy and uniform in time as long as the sensors are active. The x-ray source is produced by a laser irradiated Ge foil. Our results indicate that the x-ray source lasts during the whole duration of the main laser pulse. Both time-resolved and time-integrated spectral data indicate that the line emission is dominated by the He-α complex over higher energy emission lines. Time-integrated spectra agree well with a one-dimensional Cartesian simulation using HYDRA that predicts a conversion efficiency of 0.56% when the incident intensity is 2 × 1015 W/cm2 on a Ge backlighter.

Werellapatha, K. (ORCID:0000000293154054)↗

Timing characterization of fast hCMOS sensors

We describe a method of analyzing gate profile data for ultrafast x-ray imagers that allows pixel-by-pixel determination of temporal sensitivity in the presence of substantial background oscillations. With this method, systematic timing errors in gate width and gate arrival time of up to 1 ns (in a 2 ns wide gate) can be removed. In-sensor variations in gate arrival and gate width are observed, with variations in each up to 0.5 ns. This method can be used to estimate the coarse timing of the sensor, even if errors up to several ns are present.

Benedetti, L. R. (ORCID:0000000160502983)↗