Engineering topics

Bennett, Jean M.

Publications and source records attributed to Bennett, Jean M..

3 records

NASA NTRS1992

Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques

The theory and measurement of angle-resolved scatter are described. Values of rms roughness that were obtained by using this technique to characterize four different materials are compared with values that were obtained by using a total integrated scatter measuring instrument, an optical profiler, and a mechanical profiler. The spatial frequency bandwidths and modulation transfer functions of the four instruments are different, and results are described in light of these differences.

Jacobson, R. D.↗

NASA NTRS1990

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment (both natural and induced) on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.↗

NASA NTRS1989

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment-both natural and induced-on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM Experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.↗