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Berry, Robert F.

Publications and source records attributed to Berry, Robert F..

Advanced X-Ray Inspection of Reinforced Carbon Composite Materials on the Orbiter Leading Edge Structural Subsystem (LESS)

The post return-to-flight (RTF) inspection methodology for the Orbiter Leading Edge Structural Subsystem (LESS) is currently being defined. Numerous NDT modalities and techniques are being explored to perform the flight-to-flight inspections of the reinforced carbon/carbon (RCC) composite material for impact damage, general loss of mass in the bulk layers, or other anomalous conditions that would pose risk to safe return upon re-entry. It is possible to have an impact upon ascent that is not visually observable on the surface, yet causes internal damage. Radiographic testing may be a useful NDT technique for such occurrences. The authors have performed radiographic tests on full-sized mock samples of LESS hardware with embedded image quality phantoms. Digitized radiographic film, computed radiography and flat panel digital real-time radiography was acquired using a GE Eresco 200 x-ray tube, and Se-75 and Yb-169 radioisotopes.

Hernandez, Jose M.

Modelling melt-solid interfaces in Bridgman growth

Doped epoxy models with abrupt interfaces were prepared to test radiographic and computer enhancement procedures used to study the images of melt-solid interfaces during crystal growth in Bridgman furnaces. A column averaging procedure resulted in improved images that faithfully reproduced the positions and shapes of interfaces even at very low density differences. These techniques were applied to lead tin telluride growing in Bridgman furnaces.

Barber, Patrick G.

Imaging Of Directional-Solidification Interfaces

X-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.

Fripp, Archibald L., Jr.