In-Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique
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King, Michael Patrick↗
Engineering topics
Beutler, Joshua
Publications and source records attributed to Beutler, Joshua.
Visible Light Laser Voltage Probing - Adantages and Drawback to Near Infrared Probing.
Abstract not provided.
Beutler, Joshua↗
Defect screening method for electronic circuits and circuit components using power spectrum anaylysis
A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.
Tangyunyong, Paiboon↗
Scanning method for screening of electronic devices
A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.
47 OTHER INSTRUMENTATION↗
Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.
This project investigated a recently patented Sandia technology known as visible light Laser Voltage Probing (LVP). In this effort we carefully prepared well understood and characterized samples for testing. These samples were then operated across a range of configurations to minimize the possibility of superposition of multiple photon carrier interactions as data was taken with conventional and visible light LVP systems. Data consisted of LVP waveforms and Laser Voltage Images (LVI). Visible light (633 nm) LVP data was compared against 1319 nm and 1064 nm conventional LVP data to better understand the similarities and differences in mechanisms for all wavelengths of light investigated. The full text can be obtained by reaching the project manager, Ed Cole or the Cyber IA lead, Justin Ford.
36 MATERIALS SCIENCE↗