Aging Mechanisms of ~800 nm Broad-Area Laser Diodes
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Lasers↗
Engineering topics
Boisselle, M
Publications and source records attributed to Boisselle, M.
Laser Beam Induced Current for Defect Concentration and Aging Analysis of Broad Area Laser Diodes
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Lasers↗
Determination of Laser Diode Nonradiative CarrierLifetimes using Subthreshold Power-Current-VoltageCharacteristics
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Lasers↗