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Bozack, Michael J.

Publications and source records attributed to Bozack, Michael J..

The effect of impact angle on craters formed by hypervelocity particles

The Space Power Institute (SPI) at Auburn University has conducted experiments on the effects of impact angle on crater morphology and impactor residue retention for hypervelocity impacts. Copper target plates were set at angles of 30 deg, 45 deg, 60 deg, and 75 deg from the particle flight path. For the 30 deg and 45 deg impacts, in the velocity regime greater than 8 km s(exp -1) the resultant craters are almost identical to normal incidence impacts. The only difference found was in the apparent distribution of particle residue within the crater, and further research is needed to verify this. The 60 deg and 75 deg impacts showed marked differences in crater symmetry, crater lip shape, and particle residue distribution in the same velocity regime. Impactor residue shock fractionation effects have been quantified in first-order. It is concluded that a combination of analysis techniques can yield further information on impact velocity, direction, and angle of incidence.

Hill, David C.↗

Sputter process investigation: Material and environment interaction processes investigation

The multilayer Ellipsometry program has been developed with which the thickness and the optical properties of top layer can be determined with the additional information obtained from other measurement such as the optical constant of the middle layer film. Once the proper parameters are input into the program, the multilayer Ellipsometry program which was developed by H. Kim and Dr. Fromhold gives the best possible set of the solutions for the top layer thickness or its optical index graphically on a PC screen. In this report the basic two layer Ellipsometry theory will be summarized briefly as well as the one layer case. All the code is written in Microsoft Quickbasic version 4.5 for IBM PC with a VGA color graphics monitor so that the measurement could be cross-checked out graphically on the screen.

Williams, John R.↗