Search NASA⌕ Search

Engineering topics

Breckling, Sean

Publications and source records attributed to Breckling, Sean.

14 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

47 OTHER INSTRUMENTATION↗
DOE OSTI2023

Our teams design high-resolution MeV x-ray radiography systems for National security missions [Poster]

The NNSS has been at the forefront of custom high-fidelity x-ray/gamma radiographic imaging solutions that serve our national security for over five decades. Our radiography team utilizes expertise in physics modeling and analysis, along with optical, mechanical, and electrical design, in close collaboration with our customers, to develop imaging methods and capabilities that go beyond their needs. Conceptual designs are developed through R&D efforts to provide solutions for the specific problem at hand. Field systems are designed and built in-house, then qualified utilizing a range of facilities across the National Security Enterprise. Radiographic imaging systems are deployed by our team in the most challenging environments. The NNSS has a strong math and programming team that provides novel on-site image analysis methods that extract crucial information from data returned in field tests.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2023

Extending the Asay window measurement model to high areal mass ranges [Slides]

The accretion layer addition to Asay window analysis results in new equations of motion that depend on the location of collisions within the layer. Asay window equations of motion can be represented in terms of experiment observables. Balance of linear momentum for variable mass systems provides a framework for developing equations of motion for Asay window diagnostics under a variety of operating assumptions. The growth in the accretion layer thickness during an experiment substantially influences mass and density measurements when high accumulation of areal mass is present.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2022

An automated approach to the alignment of compound refractive lenses

Compound refractive lenses (CRLs) are established X-ray focusing optics, and are used to focus the beam or image the sample in many beamlines at X-ray facilities. While CRLs are quite established, the stack of single lens elements affords a very small numerical aperture because of the thick lens profile, making them far more difficult to align than classical optical lenses that obey the thin-lens approximation. This means that the alignment must be very precise and is highly sensitive to changes to the incident beam, often requiring regular readjustments. Some groups circumvent the full realignment procedure by using engineering controls ( e.g. mounting optics) that sacrifice some of the beam's focusing precision, i.e. spot size, or resolution. While these choices minimize setup time, there are clear disadvantages. This work presents a new automated approach to align CRLs using a simple alignment apparatus that is easy to adapt and install at different types of X-ray experiments or facilities. This approach builds on recent CRL modeling efforts, using an approach based on the Stochastic Nelder–Mead (SNM) simplex method. This method is outlined and its efficacy is demonstrated with numerical simulation that is tested in real experiments conducted at the Advanced Photon Source to confirm its performance with a synchrotron beam. This work provides an opportunity to automate key instrumentation at X-ray facilities.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
DOE OSTI2021

An approach to characterizing spatial aspects of image system blur

Quantitative X-ray radiographic imaging systems that utilize a charged couple device (CCD) camera connected to a thick, monolithic scintillator can exhibit blur that varies spatially across the field of view, especially for thick scintillators used in pulse-power radiography of dynamically compressed objects. Here, a three-point approach to estimating and accounting for this effect is demonstrated by (a) using a local estimation technique to measure the effect of blurring a calibration object at key locations across the field of view, (b) combining each of the local estimates into a spatially varying blurring function via partitions of unity interpolation, and (c) resolving the effects of that blur on the image by solving an ill-posed inverse problem using a spatially varying regularization term. The technique is demonstrated on synthetic examples and actual radiographs collected at the Naval Research Laboratory’s (NRL)Mercury pulsed power facility.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2020

In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting

Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.

36 MATERIALS SCIENCE↗
DOE OSTI2020

A Dynamic Amplitude-Correcting Gradient Estimation Technique to Align X-ray Focusing Optics

High-brightness X-rays, as produced at synchrotrons and X-ray free electron laser (XFEL) facilities, are used to characterize materials in a variety of scientific experiments. In most cases, effective use of the high-energy light requires precisely-aligned focusing optics; one example being a compound refractive lens (CRL). To align a CRL, the position and rotation must be optimized along four axes. In practice, this is a labor-intensive, time-consuming manual process that can monopolize scarce experimental time at the necessary X-ray facilities. Models of the expected Xray transmission function suggest that this task can be automated; however, the temporally-varying intensity at X-ray free electron laser facilities preclude the direct use of standard implementations of optimization solvers such as steepest descent algorithms. In this paper, we propose a novel technique to estimate the gradient of noisy functions with temporally-varying amplitudes. We construct this dynamicamplitude correction by systematically sampling a fixed central location within the standard finite difference stencil, accounting for the observed changes in time, and normalizing the difference quotients against those fluctuations. In addition to a rigorous error analysis of the sampling technique, we demonstrate its efficacy in stochastic descent optimization methods. Further, we demonstrate how this approach may be implemented to optimize X-ray focusing optics at synchrotrons or XFEL facilities

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2020

An Approach to Characterizing Spatial Aspects of Image System Blur

In imaging applications, such as X-ray radiography, the experimental system setup and data capture process introduce system blur and distortion. In images taken with thick scintillators, a spatially varying system blur is observed, requiring a nonstandard approach to blur and distortion estimation and removal. We demonstrate an approach to estimation of local point spread functions using checkerboard radiographs collected at the Naval Research Laboratory and extend that into a map defining the kernel over the camera field of view.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2020

Characterizing Dislocation Defects in Dark Field X-ray Microscopy Images of Bulk Aluminum

Material defects play a large role in material response under shock loading, yet the process of how these defects initiate, propagate, and annihilate is not well understood. Using a newly developed diagnostic, dark field X-ray microscopy (DFXM), we can now visualize the behavior of dislocation defects in materials at the mesoscale under varying conditions. Using data from the European Synchrotron Radiation Facility, we apply a variety of image processing techniques to capture relevant features to locate and characterize size and orientation of dislocation defects in bulk aluminum DFXM images. Beyond simple visualization, this analysis drives statistical characterization of the defects and their dynamic response to further improve the relevant physics models.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗