Nanosecond in situ transmission electron microscope studies of the reversible Ge{sub 2}Sb{sub 2}Te{sub 5} crystalline <==> amorphous phase transformation
Chalcogenide-based phase-change materials have wide use in optical recording media and are growing in importance for use in non-volatile electronic memory. For both applications, rapid switching between the amorphous and crystalline phases is necessary, and understanding the changes during rapidly driven phase transitions is of scientific and technological significance. Laser-induced crystallization and amorphization occur rapidly and changes in atomic structure, microstructure, and temperature are difficult to observe experimentally and determine computationally. We have used nanosecond-scale time-resolved diffraction with intense electron pulses to study Ge{sub 2}Sb{sub 2}Te{sub 5} during laser crystallization. Using a unique and unconventional specimen geometry, cycling between the amorphous and crystalline phases was achieved, enabling in situ transmission electron microscope (TEM) study of both microstructural and crystallographic changes caused by repeated switching. Finite element analysis was used to simulate interactions of the laser with the nano-structured specimens and to model the rapidly changing specimen temperature. Such time-resolved experimental methods combined with simulation of experimentally inaccessible physical characteristics will be fundamental to advancing the understanding of rapidly driven phase transformations.