Measurement and Modeling of Single Event Transients in 12nm Inverters.
Abstract not provided.
Agarwal, Sapan↗
Engineering topics
Brunhaver, John Steven
Publications and source records attributed to Brunhaver, John Steven.
Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose.
Abstract not provided.
Esposito, Madeline G.↗
Evidence of Interface trap build-up irradiated 14nm Bulk FinFET Technologies.
Abstract not provided.
Privat, Aymeric↗
Fault Tracking and Modeling in Advanced Node Processors of Single Event Effects.
Abstract not provided.
Cannon, Matthew↗