Determining Radiation Response of Aging COTS Parts through Laser Dose-Rate Surveillance (LDRS) Testing
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Gauderon, Casey Rae↗
Engineering topics
Buchheit, Thomas Edward
Publications and source records attributed to Buchheit, Thomas Edward.
Investigating the Effects of Individual Neutron-Induced Defects in Bipolar Junction Transistors
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Banerjee, Sneha↗
TCAD-Optimization Coupling Enabled TID Modeling and Calibration of Commercial SiC Power MOSFET
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Gao, Xujiao↗
Recent Advances in Functional Data Analysis for Electronic Device Data
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Adams, Jason Ross↗
Recent Advances in Functional Data Analysis for Electronic Devices
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Adams, Jason Ross↗