Challenges of Interpreting and Applying New J-STD-001 Cleanliness Standards in High Reliability Applications
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Capen, William↗
Engineering topics
Capen, William
Publications and source records attributed to Capen, William.
Challenges of Interpreting and Applying New IPC-J-STD-001 Cleanliness Standards in High-Reliability Applications
The electronics industry has rapidly and widely embraced the replacement of ROSE testing with an SIR-focused approach to testing for certification of a qualified manufacturing plan. These new cleanliness documentation standards, housed in IPC J-STD-001 Rev. H, have just begun to impact electronics manufacturers as design and production teams work through how to meet them. This research focuses on the particular challenges of applying these new standards in high-reliability product applications, through the lens of interpreting SIR test results and what they mean for process capability, repeatability and diagnosing a need for process changes. The experiments examined a variety of factors that influence SIR results and suggest areas where SIR test plans can be greatly improved.
Capen, William↗
Challenges of Interpreting and Applying New IPC-J-STD-001 Cleanliness Standards in High- Reliability Applications.
Abstract not provided.
Fowler, James↗
Standardizing Inter-Agency SMT Cleanliness Analysis in Ultra-High Reliability Applications.
Abstract not provided.
Fowler, James↗