IGA Database: Organizing IGA Data to See Trends
Explore the source record for details and available documents.
Tareq Uddin↗
Engineering topics
Publications and source records attributed to Carl Szabo.
Explore the source record for details and available documents.
The purpose of this test was to determine the heavy ion-induced single-event effect (SEE) susceptibility of the Samsung solid state drive (SSD) containing the Vertical-NAND (VNAND) flash technology. This test was supported by the NASA Electronics Parts and Packaging (NEPP) Program.