Computer controlled facility for measurement of the bidirectional scattering distribution function
A computer controlled facility for measurement of the bidirectional scattering distribution function is described, with application to the evaluation of spacecraft surface contamination in optical and thermal control systems. An automatic detector/sampleholder allows a 360-deg detector scan around the sample for a complete bidirectional reflectance and transmittance distribution function characterization. The system demonstrates reduced data acquisition and reduction cycle time, and improved accuracy.
Carosso, Paolo A.↗