Engineering topics

Carreno, V. A.

Publications and source records attributed to Carreno, V. A..

4 records

NASA NTRS1985

Single-Frequency Multitransmitter Telemetry

Telemetry technique for data collection on general aviation aircraft involved in aeronautical research consists of many sensor/transmitter units at different locations on aircraft. Individual signaling and logic at each sensor/transmitter send signals to single receiver in airplane. Transmitters operate independently on same frequency and are not synchronized to receiver, eliminating erroneous data resulting from two-transmitter overlap.

Carreno, V. A.↗

NASA NTRS1984

Upset susceptibility study employing circuit analysis and digital simulation

An approach to predict the susceptibility of digital systems to signal disturbances is described. Electrical disturbances on a digital system's input and output lines can be induced by activities and conditions including static electricity, lightning discharge, electromagnetic interference (EMI), and electromagnetic pulsation (EMP). The electrical signal disturbances employed for the susceptibility study were limited to nondestructive levels, i.e., the system does not sustain partial or total physical damage and reset and/or reload brings the system to an operational status. The front-end transition from the electrical disturbances to the equivalent digital signals was accomplished by computer-aided circuit analysis. The super-sceptre (system for circuit evaluation of transient radiation effects) programs was used. Gate models were developed according to manufacturers' performance specifications and parameters resulting from construction processes characteristic of the technology. Digital simulation at the gate and functional level was employed to determine the impact of the abnormal signals on system performance and to study the propagation characteristics of these signals through the system architecture. Example results are included for an Intel 8080 processor configuration.

Carreno, V. A.↗

NASA NTRS1984

Upset susceptibility study employing circuit analysis and digital simulation

This paper describes an approach to predicting the susceptibility of digital systems to signal disturbances. Electrical disturbances on a digital system's input and output lines can be induced by activities and conditions including static electricity, lightning discharge, Electromagnetic Interference (EMI) and Electromagnetic Pulsation (EMP). The electrical signal disturbances employed for the susceptibility study were limited to nondestructive levels, i.e., the system does not sustain partial or total physical damage and reset and/or reload will bring the system to an operational status. The front-end transition from the electrical disturbances to the equivalent digital signals was accomplished by computer-aided circuit analysis. The Super-Sceptre (system for circuit evaluation of transient radiation effects) Program was used. Gate models were developed according to manufacturers' performance specifications and parameters resulting from construction processes characteristic of the technology. Digital simulation at the gate and functional level was employed to determine the impact of the abnormal signals on system performance and to study the propagation characteristics of these signals through the system architecture. Example results are included for an Intel 8080 processor configuration.

Carreno, V. A.↗

NASA NTRS1982

A single-frequency multitransmitter telemetry technique

A telemetry technique for a special data collection system being developed for use on general aviation aircraft involved in aeronautical research programs is described. The system consists of a number of sensor-transmitter units at different locations on the aircraft, with individual signal conditioning and logic, which send sampled data signals to a single receiver in the airplane. The transmitters operate independently on the same frequency and are not synchronized to the receiver. The problem of reception of multiple samples simultaneously is treated by discarding such samples. An overlap detection technique for the frequency shift keyed modulation system is described. The amount of predicted data loss due to overlap is presented and compared with results obtained with a circuit implementation; the effects of discarded data on accuracy is discussed.

Carreno, V. A.↗