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Cataldo, Giuseppe

Publications and source records attributed to Cataldo, Giuseppe.

Infrared Telescopes: An Invaluable Resource to Unravel the Mysteries of the Universe

Infrared telescopes are a powerful tool to probe a wide range of environments in the universe in order to understand how galaxies evolved over billions of years, how stars and planets form, and how life came to be. Observing in the infrared enables detecting the faint heat signals emitted by these far-distant objects, providing unique insights into the physical processes leading to the evolution of the universe and its contents.This presentation will provide an overview of some of the NASA missions under development, which aim to design, build and operate state-of-the art telescopes to address such scientific questions. Emphasis will be given to the James Webb Space Telescope, the technological challenges encountered during its realization and the countless spin-offs it has generated, which benefit life on Earth every day. My specific contributions to this project, as well as those from some ISAE-SUPAERO students who have worked with me, will be briefly highlighted.

Cataldo, Giuseppe

Second-Generation Micro-Spec: A Compact Spectrometer for Far-Infrared and Submillimeter Space Missions

Micro-Spec is a direct-detection spectrometer which integrates all the components of a diffraction-grating spectrometer onto a ≈ 10-sq.cm chip through the use of superconducting microstrip transmission lines on a single- crystal silicon substrate. The second generation of Micro-Spec is being designed to operate with a spectral re- solution of at least 512 in the far-infrared and submillimeter (420–540 GHz, 714–555 μm) wavelength range, a band of interest for NASA's experiment for cryogenic large-aperture intensity mapping called EXCLAIM. EXCLAIM will be a balloon-borne telescope that is being designed to map the emission of redshifted carbon monoxide and singly-ionized carbon lines over a redshift range 0 < z < 3.5 and it will be the first demonstration of the Micro-Spec technology in a space-like environment. This work reviews the status of the Micro-Spec design for the EXCLAIM telescope, with emphasis on the spectrometer's two-dimensional diffractive region, through which light of different wavelengths is focused on kinetic inductance detectors along the instrument focal plane. An optimization process is used to generate a geometrical configuration of the diffractive region that satisfies l range and performance. An initial optical design optimized for n terms of geometric layout, spectral purity and efficiency.

Cataldo, Giuseppe

Model-Based Thermal System Design Optimization for the James Webb Space Telescope

Spacecraft thermal model validation is normally performed by comparing model predictions with thermal test data and reducing their discrepancies to meet the mission requirements. Based on thermal engineering expertise, the model input parameters are adjusted to tune the model output response to the test data. The end result is not guaranteed to be the best solution in terms of reduced discrepancy and the process requires months to complete. A model-based methodology was developed to perform the validation process in a fully automated fashion and provide mathematical bases to the search for the optimal parameter set that minimizes the discrepancies between model and data. The methodology was successfully applied to several thermal subsystems of the James Webb Space Telescope (JWST). Global or quasiglobal optimal solutions were found and the total execution time of the model validation process was reduced to about two weeks. The model sensitivities to the parameters, which are required to solve the optimization problem, can be calculated automatically before the test begins and provide a library for sensitivity studies. This methodology represents a crucial commodity when testing complex, large-scale systems under time and budget constraints. Here, results for the JWST Core thermal system will be presented in detail.

Cataldo, Giuseppe

Submillimeter and Far-Infrared Dielectric Properties of Thin Films

The complex dielectric function enables the study of a material's refractive and absorptive properties and provides information on a material's potential for practical application. Commonly employed line shape profile functions from the literature are briefly surveyed and their suitability for representation of dielectric material properties are discussed. An analysis approach to derive a material's complex dielectric function from observed transmittance spectra in the far-infrared and submillimeter regimes is presented. The underlying model employed satisfies the requirements set by the Kramers-Kronig relations. The dielectric function parameters derived from this approach typically reproduce the observed transmittance spectra with an accuracy of less than 4%.

Cataldo, Giuseppe

Design and Performance of A High Resolution Micro-Spec: An Integrated Sub-Millimeter Spectrometer

Micro-Spec is a compact sub-millimeter (approximately 100 GHz--1:1 THz) spectrometer which uses low loss superconducting microstrip transmission lines and a single-crystal silicon dielectric to integrate all of the components of a diffraction grating spectrometer onto a single chip. We have already successfully evaluated the performance of a prototype Micro-Spec, with spectral resolving power, R=64. Here we present our progress towards developing a higher resolution Micro-Spec, which would enable the first science returns in a balloon flight version of this instrument. We describe modifications to the design in scaling from a R=64 to a R=256 instrument, as well as the ultimate performance limits and design concerns when scaling this instrument to higher resolutions.

spectrometer

Infrared Dielectric Properties of Low-Stress Silicon Oxide

Silicon oxide thin films play an important role in the realization of optical coatings and high-performance electrical circuits. Estimates of the dielectric function in the far- and mid-infrared regime are derived from the observed transmittance spectrum for a commonly employed low-stress silicon oxide formulation. The experimental, modeling, and numerical methods used to extract the dielectric function are presented.

Silicon oxide

Overview of the Design, Fabrication and Performance Requirements of Micro-Spec, an Integrated Submillimeter Spectrometer

Micro-Spec is a compact submillimeter (350-700 GHz) spectrometer which uses low loss superconducting niobium microstrip transmission lines and a single-crystal silicon dielectric to integrate all of the components of a grating-analog spectrometer onto a single chip. Here we present details of the fabrication and design of a prototype Micro-Spec spectrometer with resolution, R64, where we use a high-yield single-flip wafer bonding process to realize instrument components on a 0.45 m single-crystal silicon dielectric. We discuss some of the electromagnetic design concerns (such as loss, stray-light, cross-talk, and fabrication tolerances) for each of the spectrometer components and their integration into the instrument as a whole. These components include a slot antenna with a silicon lens for optical coupling, a phase delay transmission line network, parallel plate waveguide interference region, and aluminum microstrip transmission line kinetic inductance detectors with extremely low cross-talk and immunity to stray light. We have demonstrated this prototype spectrometer with design resolution of R64. Given the optical performance of this prototype, we will also discuss the extension of this design to higher resolutions suitable for balloon-flight.

spectrometer

Micro-Spec: an Integrated, Direct-Detection Spectrometer for Far-Infrared and Submillimeter Astronomy

The far-infrared and submillimeter portions of the electromagnetic spectrum provide a unique view of the astrophysical processes present in the early universe. Our ability to fully explore this rich spectral region has been limited, however, by the size and cost of the cryogenic spectrometers required to carry out such measurements. Micro-Spec (u-Spec) is a high-sensitivity, direct-detection spectrometer concept working in the 450-1000 micromillimeter wavelength range which will enable a wide range of flight missions that would otherwise be challenging due to the large size of current instruments with the required spectral resolution and sensitivity. The spectrometer design utilizes two internal antenna arrays, one for transmitting and one for receiving, superconducting microstrip transmission lines for power division and phase delay, and an array of microwave kinetic inductance detectors (MKIDs) to achieve these goals. The instrument will be integrated on a approximately 10 square cm silicon chip and can therefore become an important capability under the low background conditions accessible via space and high-altitude borne platforms. In this paper, an optical design methodology for Micro-Spec is presented, with particular attention given to its twodimensional diffractive region, where the light of different wavelengths is focused on the different detectors. The method is based on the maximization of the instrument resolving power and minimization of the RMS phase error on the instrument focal plane. This two-step optimization can generate geometrical configurations given specific requirements on spectrometer size, operating spectral range and performance. A point design with resolving power of 257, an RMS phase error less than 0.1 radians and four stigmatic points was developed for initial demonstration and will be the basis of future instruments with resolving power up to about 1200.

microwave kinetic inductance detectors (MKIDs)

An Analysis Method for Superconducting Resonator Parameter Extraction with Complex Baseline Removal

A new semi-empirical model is proposed for extracting the quality (Q) factors of arrays of superconducting microwave kinetic inductance detectors (MKIDs). The determination of the total internal and coupling Q factors enables the computation of the loss in the superconducting transmission lines. The method used allows the simultaneous analysis of multiple interacting discrete resonators with the presence of a complex spectral baseline arising from reflections in the system. The baseline removal allows an unbiased estimate of the device response as measured in a cryogenic instrumentation setting.

semi-empirical model

Micro-spec: an Integrated Direct-detection Spectrometer for Far-infrared Space Telescopes

The far-infrared and submillimeter portions of the electromagnetic spectrum provide a unique view of the astrophysical processes present in the early universe. Our ability to fully explore this rich spectral region has been limited, however, by the size and cost of the cryogenic spectrometers required to carry out such measurements.Micro-Spec (μ-Spec) is a high-sensitivity, direct-detection spectrometer concept working in the 450-1000 (micrometers) wavelength range which will enable a wide range of flight missions that would otherwise be challenging due tothe large size of current instruments with the required spectral resolution and sensitivity. The spectrometer design utilizes two internal antenna arrays, one for transmitting and one for receiving, superconducting microstrip transmission lines for power division and phase delay, and an array of microwave kinetic inductance detectors (MKIDs) to achieve these goals. The instrument will be integrated on a approximately 10 sq cm silicon chip and can therefore become an important capability under the low background conditions accessible via space and high-altitude borne platforms. In this paper, an optical design methodology for micro-Spec is presented, with particular attention given to its two-dimensional diffractive region, where the light of different wavelengths is focused on the different detectors. The method is based on the maximization of the instrument resolving power and minimization of the RMS phase error on the instrument focal plane. This two-step optimization can generate geometrical configurations given specific requirements on spectrometer size, operating spectral range and performance.Two point designs with resolving power of 260 and 520 and an RMS phase error less than approximately 0.004 radians were developed for initial demonstration and will be the basis of future instruments with resolving power up to about 1200.

Far-infrared

Micro-Spec: An Ultracompact, High-sensitivity Spectrometer for Far-Infrared and Submillimeter Astronomy

High-performance, integrated spectrometers operating in the far-infrared and submillimeter ranges promise to be powerful tools for the exploration of the epochs of reionization and initial galaxy formation. These devices, using high-efficiency superconducting transmission lines, can achieve the performance of a meter-scale grating spectrometer in an instrument implemented on a 4 inch silicon wafer. Such a device, when combined with a cryogenic telescope in space, provides an enabling capability for studies of the early universe. Here, the optical design process for Micro-Spec (micron-Spec) is presented, with particular attention given to its two-dimensional diffractive region, where the light of different wavelengths is focused on the different detectors. The method is based on the stigmatization and minimization of the light path function in this bounded region, which results in an optimized geometrical configuration. A point design with an efficiency of (is) approximately 90% has been developed for initial demonstration and can serve as the basis for future instruments. Design variations on this implementation are also discussed, which can lead to lower efficiencies due to diffractive losses in the multimode region.

cryogenic telescope

Micro-Spec: An Ultra-Compact, High-Sensitivity Spectrometer for Far-Infrared and Sub-Millimeter Astronomy

High-performance, integrated spectrometers operating in the far-infrared and sub-millimeter promise to be powerful tools for the exploration of the epochs of reionization and initial galaxy formation. These devices, using high-efficiency superconducting transmission lines, can achieve the performance of a meter-scale grating spectrometer in an instrument implemented on a four-inch silicon wafer. Such a device, when combined with a cryogenic telescope in space, provides an enabling capability for studies of the early universe. Here, the optical design process for Micro-Spec (mu-Spec) is presented, with particular attention given to its two-dimensional diffractive region, where the light of different wavelengths is focused on the different detectors. The method is based on the stigmatization and minimization of the light path function in this bounded region, which results in an optimized geometrical configuration. A point design with an efficiency of approx. 90% has been developed for initial demonstration, and can serve as the basis for future instruments. Design variations on this implementation are also discussed, which can lead to lower efficiencies due to diffractive losses in the multimode region.

spectroscopic instrumentation

Mu-Spec: A High Performance Compact Spectrometer for Submillimeter Astronomy

We describe the Mu-Spec, an extremely compact high performance spectrometer for the submillimeter and millimeter spectral ranges. We have designed a fully integrated submillimeter spectrometer based on superconducting microstrip technology and fabricated its critical elements. Using low loss transmission lines, we can produce a fully integrated high resolution submillimeter spectrometer on a single four inch Si wafer. A resolution of 500 can readily be achieved with standard fabrication tolerance, higher with phase trimming. All functions of the spectrometer are integrated - light is coupled to the microstrip circuit with a planar antenna, the spectra discrimination is achieved using a synthetic grating, orders are separated using a built-in planar filter, and the light is detected using photon counting Microwave Kinetic Inductance Detectors (MKID). We will discus the design principle of the instrument, describe its technical advantages, and report the progress on the development of the instrument.

Hsieh, Wen-Ting

Infrared Dielectric Properties of Low-stress Silicon Nitride

Silicon nitride thin films play an important role in the realization of sensors, filters, and high-performance circuits. Estimates of the dielectric function in the far- and mid-IR regime are derived from the observed transmittance spectra for a commonly employed low-stress silicon nitride formulation. The experimental, modeling, and numerical methods used to extract the dielectric parameters with an accuracy of approximately 4% are presented.

dielectric parameters

Design and Performance of Micro-Spec, an Ultra Compact High-Sensitivity Far-Infrared Spectrometer for SPICA

Micro-Spec (u-Spec) is a high-performance spectrometer working in the 250-700-micrometer wavelength range, whose modules use low-loss superconducting microstrip transmission lines on a single 4-inch-diameter silicon wafer. Creating the required phase delays in transmission lines rather than free space allows such an instrument to have, in principle, the performance of a meter-scale grating spectrometer. Such a dramatic size reduction enables classes of instruments for space that would be impossible with conventional technologies. This technology can dramatically enhance the long-wavelength capability of the space infrared telescope for cosmology and astrophysics SPICA. u-Spec is analogous to a grating spectrometer. The phase retardation generated by the reflection from the grating grooves is instead produced by propagation through a transmission line. The power received by a broadband antenna is progressively divided by binary microstrip power dividers, and the required phase delays are generated by different lengths of microstrip transmission lines. by arranging these outputs along a circular focal surface, the analog of a Rowland spectrometer can he created. The procedure to optimize the Micro-Spec design is based on the stigmatization and minimization of the light path function in a two-dimensional hounded region, which results in an optimized geometry arrangement with three stigmatic points. In addition, in order to optimize the overall efficiency of the instrument, the emitters are directed to the center of the focal surface. The electric field amplitude and phase as well as the power transmitted and absorbed throughout the region are analyzed. Measurements are planned in late summer to validate the designs.

Cataldo, Giuseppe