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Chen, C. -T.

Publications and source records attributed to Chen, C. -T..

A GROWTH-RATE INDICATOR FOR COMPTON-THICK ACTIVE GALACTIC NUCLEI

Due to their heavily obscured central engines, the growth rate of Compton-thick (CT) active galactic nuclei (AGNs) is difficult to measure. A statistically significant correlation between the Eddington ratio, λ {sub Edd}, and the X-ray power-law index, Γ, observed in unobscured AGNs offers an estimate of their growth rate from X-ray spectroscopy (albeit with large scatter). However, since X-rays undergo reprocessing by Compton scattering and photoelectric absorption when the line of sight to the central engine is heavily obscured, the recovery of the intrinsic Γ is challenging. Here we study a sample of local, predominantly CT megamaser AGNs, where the black hole mass, and thus Eddington luminosity, are well known. We compile results of the X-ray spectral fitting of these sources with sensitive high-energy ( E > 10 keV) NuSTAR data, where X-ray torus models, which take into account the reprocessing effects have been used to recover the intrinsic Γ values and X-ray luminosities, L {sub X}. With a simple bolometric correction to L {sub X} to calculate λ {sub Edd}, we find a statistically significant correlation between Γ and λ {sub Edd} ( p = 0.007). A linear fit to the data yields Γ = (0.41 ± 0.18)log{sub 10} λ {sub Edd} + (2.38 ± 0.20), which is statistically consistent with results for unobscured AGNs. This result implies that torus modeling successfully recovers the intrinsic AGN parameters. Since the megamasers have low-mass black holes ( M {sub BH} ≈ 10{sup 6}–10{sup 7} M {sub ⊙}) and are highly inclined, our results extend the Γ– λ {sub Edd} relationship to lower masses and argue against strong orientation effects in the corona, in support of AGN unification. Finally this result supports the use of Γ as a growth-rate indicator for accreting black holes, even for CT AGNs.

79 ASTRONOMY AND ASTROPHYSICS↗

A new time calibration method for switched-capacitor-array-based waveform samplers

Here we have developed a new time calibration method for the DRS4 waveform sampler that enables us to precisely measure the non-uniform sampling interval inherent in the switched-capacitor cells of the DRS4. The method uses the proportionality between the differential amplitude and sampling interval of adjacent switched-capacitor cells responding to a sawtooth-shape pulse. In the experiment, a sawtooth-shape pulse with a 40 ns period generated by a Tektronix AWG7102 is fed to a DRS4 evaluation board for calibrating the sampling intervals of all 1024 cells individually. The electronic time resolution of the DRS4 evaluation board with the new time calibration is measured to be ~2.4 ps RMS by using two simultaneous Gaussian pulses with 2.35 ns full-width at half-maximum and applying a Gaussian fit. The time resolution dependencies on the time difference with the new time calibration are measured and compared to results obtained by another method. Ultimately, the new method could be applicable for other switched-capacitor-array technology-based waveform samplers for precise time calibration.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗