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Chen, W. W.

Publications and source records attributed to Chen, W. W..

In Situ Observation of Adiabatic Shear Band Formation in Aluminum Alloys

We used high-speed X-ray phase contrast imaging and infrared thermal imaging techniques to study the formation processes of adiabatic shear bands in aluminum 7075-T6 and 6061-T6 alloys. A modified compression Kolsky bar setup was used to apply the dynamic loading. A flat hatshaped specimen design was adopted for generating the shear bands at the designated locations. Experimental results show that 7075-T6 exhibits less ductility and a narrower shear band than 6061-T6. Maximum temperatures of 720 K and 770 K were locally determined within the shear band zones for 7075-T6 and 6061-T6 respectively. This local high temperature zone and the resulting thermal instability were found to relate to the shear band formation in these aluminum alloys.

36 MATERIALS SCIENCE↗

A compressed sensing X-ray camera with a multilayer architecture

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. In this work, we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.

47 OTHER INSTRUMENTATION↗

Random On-Board Pixel Sampling (ROPS) X-Ray Camera

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. Here we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗