Discrete Binning Analysis of Single Event Transient Pulse Width for Rate Calculations
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Michael J Campola↗
Engineering topics
Christina Seidleck
Publications and source records attributed to Christina Seidleck.
Recent Radiation Test Results on a 22FDX Test Vehicle
Total ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
total ionizing dose↗
Recent Radiation Test Results on a 22FDX Test Vehicle
Total ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
total ionizing dose↗
Vorago RH-OBC-1 Single Event Effect Characterization Test Report
The Vorago Technologies RH-OBC-1 is a CubeSat Kit Bus compatible single board computer with a Vorago VA10820 ARM Cortex-M0 microcontroller at its core. The board also includes a set of common peripheral integrated circuits, like voltage regulators, non-volatile memories (NVM), an analog-to-digital converter (ADC), a watchdog/supervisor, and a Controller Area Network (CAN) bus transceiver. High-energy proton (200 MeV) testing was conducted at both board and component levels to investigate single-event effects.
CubeSat compatible board↗