Engineering topics
Chu, Y
Publications and source records attributed to Chu, Y.
The BigBoss Experiment
BigBOSS is a Stage IV ground-based dark energy experiment to study baryon acoustic oscillations (BAO) and the growth of structure with a wide-area galaxy and quasar redshift survey over 14,000 square degrees. It has been conditionally accepted by NOAO in response to a call for major new instrumentation and a high-impact science program for the 4-m Mayall telescope at Kitt Peak. The BigBOSS instrument is a robotically-actuated, fiber-fed spectrograph capable of taking 5000 simultaneous spectra over a wavelength range from 340 nm to 1060 nm, with a resolution R = {lambda}/{Delta}{lambda} = 3000-4800. Using data from imaging surveys that are already underway, spectroscopic targets are selected that trace the underlying dark matter distribution. In particular, targets include luminous red galaxies (LRGs) up to z = 1.0, extending the BOSS LRG survey in both redshift and survey area. To probe the universe out to even higher redshift, BigBOSS will target bright [OII] emission line galaxies (ELGs) up to z = 1.7. In total, 20 million galaxy redshifts are obtained to measure the BAO feature, trace the matter power spectrum at smaller scales, and detect redshift space distortions. BigBOSS will provide additional constraints on early dark energy and on the curvature of the universe by measuring the Ly-alpha forest in the spectra of over 600,000 2.2 < z < 3.5 quasars. BigBOSS galaxy BAO measurements combined with an analysis of the broadband power, including the Ly-alpha forest in BigBOSS quasar spectra, achieves a FOM of 395 with Planck plus Stage III priors. This FOM is based on conservative assumptions for the analysis of broad band power (k{sub max} = 0.15), and could grow to over 600 if current work allows us to push the analysis to higher wave numbers (k{sub max} = 0.3). BigBOSS will also place constraints on theories of modified gravity and inflation, and will measure the sum of neutrino masses to 0.024 eV accuracy.
Three-dimensional microstructural changes in the Ni–YSZ solid oxide fuel cell anode during operation
Explore the source record for details and available documents.
Nondestructive volumetric 3-D chemical mapping of nickel-sulfur compounds at the nanoscale
Nano-structures of nickel (Ni) and nickel subsulfide (Ni{sub 3}S{sub 2}) materials were studied and mapped in 3D with high-resolution x-ray nanotomography combined with full field XANES spectroscopy. This method for characterizing these phases in complex microstructures is an important new analytical imaging technique, applicable to a wide range of nanoscale and mesoscale electrochemical systems.
Application of Partially coherent Wavefront Propagation Calculations for Design of Coherence-Preserving Synchrotron Radiation Beamlines
Ultra-low emittance third-generation synchrotron radiation (SR) sources, such as NSLS-II and MAX-IV, will offer excellent opportunities for further development of experimental techniques exploiting X-ray coherence. However, even in these new SR sources, the radiation produced by relativistic electrons (in undulators, wigglers and bending magnets) will remain only partially coherent in the X-ray spectral range. 'Extraction' of 'coherent portion' of the radiation flux and its transport to sample without loss of coherence must be performed by dedicated SR beamlines, optimized for particular types of experiments. Detailed quantitative prediction of partially coherent X-ray beam properties at propagation through optical elements, which is required for the optimization of such beamlines, can only be obtained from accurate and efficient physical-optics based numerical simulations. Examples of such simulations, made for NSLS-II beamlines, using 'Synchrotron Radiation Workshop' (SRW) computer code, are presented. Special attention is paid to the numerical analysis of the basic properties of partially coherent undulator radiation beam and its distinctions from the Gaussian beam. Performance characteristics of importance for particular beamlines, such as radiation spot size and flux at sample vs size of secondary source aperture for high-resolution microscopy beamlines, are predicted by the simulations.
High-resolution Hard-x-ray Microscopy using Second-order Zone-plate Diffraction
Odd-order diffraction of zone plates (ZPs) is already used for x-ray microscopy but the potential offered by even-order diffraction must still be fully exploited. Width differences between lines and interline spaces transfer intensity from odd-order to even-order diffractions. Here we show that the resulting intense second-order diffraction provides a reasonable tradeoff between spatial resolution and intensity - and constitutes a viable strategy for x-ray microscopy to reach sub-20 nm resolution, in spite of the imperfections of high-aspect-ratio ZPs and of other difficulties.