Reliability Estimation for One-Shot Devices (Rev. 1)
We present an engineering-oriented summary of statistical methods for estimation of the reliability (or equivalently, failure probability) of one-shot devices such as explosive detonators and other weapon components. Estimates may be given as single points or intervals, based on pass/fail tests, margin analysis, computational models, expert judgment, or a combination of these. We focus on highly reliable devices for which few or no failures are expected to occur in testing.
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