Membrane Thickness Impact on Chemical Degradation Rates
Abstract A comprehensive investigation of PFSA membrane chemical degradation rates as a function of thickness (8-20 µm) is reported. The two-pronged study was conducted on bare membranes and as components of chemically-mitigated and mechanically-reinforced, state-of-the-art (SOA) membrane electrode assemblies (MEAs). The bare membranes were subjected to H2O2 vapor test and MEAs were degraded under OCV conditions, both at 90°C. Both test types employed fluoride release rates (FRR) to monitor chemical degradation rates. Vapor tests revealed that area-specific degradation rates were positively correlated with membrane thickness, but thickness normalized degradation rates were independent of thickness. Open-circuit voltage (OCV) investigations spanning the membrane thickness series of MEAs was probed via a 27-experiment 3(4-1) fractional factorial experimental design. Statistical analysis of the FRR values revealed that chemical degradation rates were dominated by the relative humidity value and that the area-specific degradation rates of MEAs were independent of membrane thickness. The OCV chemical durability insensitivity to membrane thickness is supported by on-load membrane chemical durability studies at the stack level. The results suggest that ,despite smaller ionomer inventory, SOA thin membranes and MEAs are not greatly disadvantaged relative to thicker membranes from a chemical durability perspective, provided oxidative stress levels are controlled throughout application lifetime.