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Cook, Philip K.

Publications and source records attributed to Cook, Philip K..

X-ray induced grain boundary formation and grain rotation in Bi 2 Se 3

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. Here, in this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi 2 Se 3 ) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X-ray radiation can rapidly change size and texture of grains.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

47 OTHER INSTRUMENTATION↗

Element differentiation with a Hartmann- based X-ray phase imaging system

Significant efforts are currently ongoing in X-ray imaging to provide multimodal imaging systems, targeting better sensitivity and specificity for both biomedical or non-destructive testing applications. Knowing the elemental composition of specific structures, such as breast microcalcifications in mammography, would help to differentiate malign and benign tumours. Standard X-ray Phase Contrast Imaging techniques provide only qualitative information on elements with similar absorption properties. However, their chemical composition can be determined from the measurement of the phase as it is directly related to the optical index of elemental materials. We will show new experimental results obtained with an X-ray phase imaging system based on a Hartmann mask. Early data treatment succeeded in retrieving both the real and imaginary parts of the refractive index. The system demonstrates the capability to discriminate materials based on elemental composition.

36 MATERIALS SCIENCE↗