Diversity of the initial rocky planetary building materials at the edge of the solar system
Explore the source record for details and available documents.
D. E. Brownlee↗
Engineering topics
D. J. Joswiak
Publications and source records attributed to D. J. Joswiak.
Early History of Ryugu’s Parent Asteroid: Evidence from Return Sample
Near-Earth Cb-type asteroid (162173) Ryugu is a rubble pile asteroid made of fragments of the original parent asteroid [1-5]. It is possible that the fragments from various depths of the original asteroid are on the surface of the present-day Ryugu. Therefore, samples collected from Ryugu are expected to retain formation and evolution history of the interior of Ryugu’s parent asteroid. In this study, we will focus on understanding the early history of Ryugu’s parent asteroid. For this purpose, we need to understand: 1) when and where in the solar nebula Ryugu’s parent asteroid formed, 2) the original mineralogy and the abundance and composition of water-rich ice in the accreted materials, 3) how these materials chemically and mineralogically evolved, and 4) how the parent body was destroyed by a catastrophic collision.
T. Nakamura↗
Analysis of "Stone" Samples from C-Type Asteroid Ryugu
As a part of activities of initial analysis, we analyzed eighteen Ryugu “stone” samples of 1 ~ 8mm in size: seven stones from the 1st touch down site and eleven from the 2nd touch down site. Ryugu stones were analyzed first using X-rays, UV, visible, near-infrared, mid-infrared, and muon probes for surface reflectance spectra, internal 3D structure and element distribution, crystal structures, and bulk composition of light elements such as C, N, and O. Measurements for magnetic, thermal, and physical properties using some stones were also performed. TOF-SIMS analysis of fluid inclusions as being continued. Small particles separated from some stones were analyzed by IR-CT. Based on 3D-CT images of individual stones, objects of interests were identified, separated by pFIB cutting, and exposed by polishing on the surface of epoxy disks. FE-EPMA/FE-SEM analysis was made on ~40 polished epoxy disks for chemical composition and textural observation. FIB sections and small (~15 μm in size) fragments were separated from polished surface and analyzed by TEM, STXM,XRF, and nano-CT.
T. Nakamura↗