A study in using MICROMEGAS to improve particle identification with the TAMU-MDM focal plane detector
A MICROMEGAS detection amplifier has been incorporated into the design of the TAMU-MDM focal plane detector with the purpose of improving the energy resolution and thus, the particle identification. Furthermore, beam tests showed a factor of 2 improvement over the original design, from 10%–12% to 4%–6%, for ions with A ≤ 40 at E/A ~ 10–20 MeV.