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Datta, Amlan (ORCID:0000000181012457)

Publications and source records attributed to Datta, Amlan (ORCID:0000000181012457).

Quasiparticle spectroscopy in technologically relevant niobium using London penetration depth measurements: experiment and theory

Abstract The London penetration depth, λ ( T ) , was measured in various forms of niobium, including foils, thin films, single crystals, and samples from superconducting radio-frequency (SRF) cavities. We observed a significant difference in λ ( T ) at low temperatures, T < T c / 3 , due to low-energy quasiparticles. In particular, an unusual downturn of λ ( T ) on cooling in the SRF cavity samples required to take into account deep in-gap bound states. Theoretical modeling using the generalized Dynes density of states shows that such in-gap states lead to a downturn or a peak in λ ( T ) upon cooling. Combined, experimental and theoretical findings provide a method for detecting two-level systems or states related to magnetic impurities in the bulk of niobium. This result is particularly relevant for the quantum informatics sciences technologies used in qubits and circuit quantum electrodynamics architecture based on SRF cavities.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Exploring the relationship between deposition method, microstructure, and performance of Nb/Si-based superconducting coplanar waveguide resonators

Superconducting quantum circuits (SQC) are one of the most promising hardware platforms for quantum computing, yet their performance is currently limited by the presence of various structural defects inside the circuit's structure. Despite impressive progress in the past decade, a precise understanding of the origin of these defects from various fabrication processes and their impact on coherence is still lacking. Here, in this study, we performed a comprehensive investigation on the microstructure, superconductivity, and resonator quality factor of Nb films deposited by high-power impulse magnetron sputtering (HiPIMS) and direct current (DC) magnetron sputtering. A suite of characterization techniques, including electron microscopy with spectroscopy, secondary ion mass spectrometry, magneto-optical microscopy, and pump-probe reflectivity spectroscopy is used. We reveal that niobium (Nb) resonators fabricated using HiPIMS exhibit a smaller average grain size, thicker surface oxide with larger thickness variations (rougher surface), and a thicker amorphous Nb/Si interface layer compared to samples deposited by DC sputtering. We identified that the amorphous Nb oxides (mainly located at the Nb surface and along the grain boundaries) and Nb-Si amorphous layers (at the Nb/Si interface) are major and potential sources of two-level system (TLS), while off-stochiometric oxides and suboxides of Nb close to the surface, crystalline defects (i.e., dislocations at grain boundary, point defects introduced during deposition) are main contributors of non-TLS sources. Our findings clarify the relationship between different defects and coherence loss mechanisms, highlighting the importance of material microstructure control on performance optimization in SQC.

36 MATERIALS SCIENCE↗