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Dvorak, Joseph

Publications and source records attributed to Dvorak, Joseph.

Wave optics simulations for new soft x-ray beamlines at NSLS-II

In this work, we performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.

36 MATERIALS SCIENCE↗

Narrow-band EUV Multilayer Coating for the MOSES Sounding Rocket

The Multi-order Solar EUV Spectrograph (MOSES) is a slitless spectrograph designed to study solar He II emission at 303.8 Angstroms, to be launched on a sounding rocket payload. One difference between MOSES and other slitless spectrographs is that the images are recorded simultaneously at three spectral orders, m = -1,0, +l. Another is the addition of a narrow-band multilayer coating on both the grating and the fold flat, which will reject out-of-band lines that normally contaminate the image of a slitless instrument. The primary metrics f a the mating were high peak reflectivity and suppression of Fe XV and XVI emission lines at 284 Angstroms and 335 Angstroms, respectively. We chose B4C/Mg2Si for our material combination since it provides better values for all three metrics together than the other leading candidates Si/Ir, Si/B4C or Si/SiC. Measurements of witness flats at NIST indicate the peak reflectivity at 303.6 is 38.5% for a 15 bilayer stack, while the suppression at 284 Angstroms, is 4.5x and at 335 Angstroms is 18.3x for each of two reflections in the instrument. We present the results of coating the MOSES flight gratings and fold flat, including the spectral response of the fold flat and grating as measured at NIST's SURF III and Brookhaven's X24C beamline.

Owens, Scott M.↗