Energy-loss- and thickness-dependent contrast in atomic-scale electron energy-loss spectroscopy
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Tan, Haiyan↗
Engineering topics
Dwyer, Christian
Publications and source records attributed to Dwyer, Christian.
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?
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Xin, Huolin L. (ORCID:000000026521868X)↗