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DOE OSTI2020

An Approach to Characterizing Spatial Aspects of Image System Blur

In imaging applications, such as X-ray radiography, the experimental system setup and data capture process introduce system blur and distortion. In images taken with thick scintillators, a spatially varying system blur is observed, requiring a nonstandard approach to blur and distortion estimation and removal. We demonstrate an approach to estimation of local point spread functions using checkerboard radiographs collected at the Naval Research Laboratory and extend that into a map defining the kernel over the camera field of view.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2020

Characterizing Dislocation Defects in Dark Field X-ray Microscopy Images of Bulk Aluminum

Material defects play a large role in material response under shock loading, yet the process of how these defects initiate, propagate, and annihilate is not well understood. Using a newly developed diagnostic, dark field X-ray microscopy (DFXM), we can now visualize the behavior of dislocation defects in materials at the mesoscale under varying conditions. Using data from the European Synchrotron Radiation Facility, we apply a variety of image processing techniques to capture relevant features to locate and characterize size and orientation of dislocation defects in bulk aluminum DFXM images. Beyond simple visualization, this analysis drives statistical characterization of the defects and their dynamic response to further improve the relevant physics models.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗