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Eubanks, A. G.

Publications and source records attributed to Eubanks, A. G..

12 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1976

Noise limitations of multiplier phototubes in the radiation environment of space

The contributions of Cerenkov emission, luminescence, secondary electron emission, and bremsstrahlung to radiation-induced data current and noise of multiplier phototubes were analyzed quantitatively. Fluorescence and Cerenkov emission in the tube window are the major contributors and can quantitatively account for dark count levels observed in orbit. Radiation-induced noise can be minimized by shielding, tube selection, and mode of operation. Optical decoupling of windows and cathode (side-window tubes) leads to further reduction of radiation-induced dark counts, as does reducing the window thickness and effective cathode area, and selection of window/cathode combinations of low fluorescence efficiency. In trapped radiation-free regions of near-earth orbits and in free space, Cerenkov emission by relativistic particles contributes predominantly to the photoelectron yield per event. Operating multiplier phototubes in the photon (pulse) counting mode will discriminate against these large pulses and substantially reduce the dark count and noise to levels determined by fluorescence.

Viehmann, W.↗
NASA NTRS1975

Photomultiplier window materials under electron irradiation - Fluorescence and phosphorescence

The fluorescence and phosphorescence of photomultiplier window materials under electron irradiation have been investigated using a Sr-90/Y-90 beta emitter as the electron source. Spectral emission curves of UV-grade, optical-grade, and electron-irradiated samples of MgF2 and LiF, and of CaF2, BaF2, sapphire, fused silica, and UV-transmitting glasses were obtained over the 200-650-nm spectral range. Fluorescence yields were determined on these materials utilizing photomultiplier tubes with cesium telluride, bialkali, and trialkali (S-20) photocathodes, respectively. Optical-grade MgF2 and LiF, as well as electron-irradiated UV-grade samples of these two materials, show enhanced fluorescence due to color-center formation and associated emission bands in the blue and red wavelength regions. Large variations in fluorescence intensities were found in UV-grade sapphire samples of different origins, particularly in the red end of the spectrum, presumably due to various amounts of chromium-ion content. Phosphorescence decay with time is best described by a sum of exponential terms, with time constants ranging from a few minutes to several days.

Viehmann, W.↗
NASA NTRS1974

Luminescence of powdered uranium glasses

Measurement of cathodoluminescence and photoluminescence efficiencies in powdered borosilicate glasses having different particle size and different uranium content. Excitation with 100 to 350 keV electrons and with 253.7 nm light was found to produce identical absolute radiant exitance spectra in powdered samples. The most efficient glass was one containing 29.4 wt% B2O3, 58.8 wt% SiO2, 9.8 wt% Na2O and 2.0 wt% UO2.

Eubanks, A. G.↗
NASA NTRS1974

Fluorescence and phosphorescence of photomultiplier window materials under electron irradiation

The fluorescence and phosphorescence of photomultiplier window materials under electron irradiation were investigated using a Sr-90/Y-90 beta emitter as the electron source. Spectral emission curves of UV grade, optical grade, and electron-irradiated samples of MGF2 and LiF, CaF2, BaF2, sapphire, fused silica, and UV transmitting glasses were obtained over the spectral range of 200 nm to 650 nm. Fluorescence yields, expressed as the number of counts in a solid angle of 2 pi steradian per 1MeV of incident electron energy deposited, were determined on these materials utilizing photomultiplier tubes with cesium telluride, bialkali, and trialkali (S-20) photocathodes, respectively.

Viehmann, W.↗
NASA NTRS1972

Effect of simulated space radiation on selected optical materials.

The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide-band-pass glass filters, narrow-bandpass thin-film interference filters, and several fused silicas was determined by transmittance measurements over the 200-3400-nm wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-yr equivalent orbital dose of electrons, nor were changes observed in the fused silicas after the same electron exposure plus a 1-yr equivalent dose of protons. Exposure to a 1/2-yr equivalent dose of solar uv radiation, however, caused a significant degradation in the transmittance of two uv-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near-ir regions. As a result of the uv exposure, the fused silicas exhibited losses of several percent over the 200-300-nm wavelength region.

Nicoletta, C. A.↗
NASA NTRS1972

Effects of simulated space radiation on selected optical materials

The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide bandpass glass filters, narrow bandpass thin film interference filters, and several fused silicas was determined by transmittance measurements over the 200 to 3400 nanom wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-year equivalent orbital dose of electrons, nor in the fused silicas after the same electron exposure plus a 1-year equivalent dose of protons. Exposure to a 1/2-year equivalent dose of solar ultraviolet radiation caused a significant degradation in the transmittance of two ultraviolet-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near infrared regions. As a result of the ultraviolet exposure the fused silicas exhibited losses of several percent over the 200- to 300 nanom wavelength region.

Nicoletta, C. A.↗
NASA NTRS1972

Effects of surface contamination on the infrared emissivity and visible-light scattering of highly reflective surfaces at cryogenic temperatures

A technique is described for the simultaneous in situ measurement of film thickness, refractive index, total normal emissivity, visible-light scattering, and reflectance of contaminant films on a highly reflective liquid-nitrogen cooled, stainless steel substrate. Emissivities and scattering data are obtained for films of water, carbon dioxide, silicone oil, and a number of aromatic and aliphatic hydrocarbons as a function of film thickness between zero and 20 microns. Of the contaminants investigated, water has by far the greatest effect on emissivity, followed by silicone oil, aliphatic hydrocarbons, aromatic hydrocarbons, and carbon dioxide. The emissivity increases more rapidly with film thickness between zero and 2.5 microns than at thicknesses greater than 2.5 microns. Scattering of visible light changes very little below 2 microns thickness but increases rapidly with thickness beyond 2 to 3 microns. The effect of contaminant films on passive radiation coolers is discussed.

Viehmann, W.↗
NASA NTRS1972

Effects of surface contamination on the infrared emissivity and visible-light scattering of highly reflective surfaces at cryogenic temperatures

A technique is described for the simultaneous in situ measurement of film thickness, refractive index, total normal emissivity, visible light scattering, and reflectance of contaminant films on a highly reflective liquid nitrogen-cooled, stainless steel substrate. Emissivities and scattering data were obtained for films of water, carbon dioxide, silicone oil, and a number of aromatic and aliphatic hydrocarbons as a function of film thickness between zero and 20 microns. Water had the greatest effect on emissivity, followed by silicone oil, aliphatic hydrocarbons, aromatic hydrocarbons, and carbon dioxide. Emissivity increased more rapidly with film thickness between zero and 2.5 microns, than at thickness greater than 2.5 microns. Scattering of visible light changed little below 2-microns thickness but increased rapidly with thickness beyond 2 to 3 microns. The effect of contaminant films on passive radiation coolers is discussed.

Viehmann, W.↗