Engineering topics

Finley, David S.

Publications and source records attributed to Finley, David S..

12 records

NASA NTRS1998

Temperature and Gravity Dependence of Trace Element Abundances in Hot DA White Dwarfs (94-EUVE-094)

EUV spectroscopy has shown that DA white dwarfs hotter than about 45,000 K may contain trace heavy elements, while those hotter than about 50,000 K almost always have significant abundances of trace heavy elements. One of our continuing challenges is to identify and determine the abundances of these trace constituents, and then to relate the observed abundance patterns to the present conditions and previous evolutionary histories of the hot DA white dwarfs.

Finley, David S.↗

NASA NTRS1994

Extreme Ultraviolet Explorer Bright Source List

Initial results from the analysis of the Extreme Ultraviolet Explorer (EUVE) all-sky survey (58-740 A) and deep survey (67-364 A) are presented through the EUVE Bright Source List (BSL). The BSL contains 356 confirmed extreme ultraviolet (EUV) point sources with supporting information, including positions, observed EUV count rates, and the identification of possible optical counterparts. One-hundred twenty-six sources have been detected longward of 200 A.

Malina, Roger F.↗

NASA NTRS1991

Results from the calibration of the Extreme Ultraviolet Explorer instruments

The paper describes the main features and selected results of the calibration of the scientific instruments to be flown on the Extreme Ultraviolet Explorer in 1991. The instrument payload includes three grazing incidence scanning telescopes and an EUV spectrometer/deep survey instrument covering the spectral region 70-800 A. The measured imaging characteristics, the effective areas, and the details of spectral responses of the instruments are presented. Diagrams of the cross-sectional views of the scanning telescope and the deep-survey/spectrometer telescope are included.

Welsh, Barry Y.↗

NASA NTRS1990

The temperature scale of hot DA white dwarfs - Temperatures from far-ultraviolet continuum fluxes

Observed far-UV to visible flux ratios of all DA white dwarfs hotter than about 25,000 K are compared with ratios predicted by models in order to derive effective temperatures for the stars. All suitable IUE spectra of seven hot DA white dwarfs for which accurate temperatures based on hydrogen line profiles were available are used to derive a flux correction to the 1980 IUE absolute calibration. Application of the corrections to the IUE spectra results in derived temperature which are consistent with the line profile temperatures.

Finley, David S.↗

NASA NTRS1988

Design of the Extreme Ultraviolet Explorer long-wavelength grazing incidence telescope optics

Designing optics for photometry in the long-wavelength portion of the EUV spectrum (400-900) A) poses different problems from those arising for optics, operating shortward of 400 A. The available filter materials which transmit radiation longward of 400 A are also highly transparent at wavelengths shortward of 100 A. Conventional EUV optics, with grazing engles of less than about 10 deg, have very high throughput in the EUV, which persists to wavelengths shortward of 100 A. Use of such optics with the longer-wavelength EUV filters thus results in an unacceptably large soft X-ray leak. This problem is overcome by developing a mirror design with larger graze angles of not less than 20 deg, which has high throughput at wavelengths longer than 400 A but at the same time very little throughput shortward of 100 A.

Finley, David S.↗

NASA NTRS1987

Surface evaluation of the grazing incidence mirrors for the Extreme Ultraviolet Explorer

The EUV scattering from the Wolter-Schwarzschild type I short wavelength scanner mirror aboard the Extreme Ultraviolet Explorer is measured, and the results are used to evaluate the surface microroughness of the mirror. It is found that the most likely values for the mirror surface are sigma = 20 A, and rho = 40 microns. These results are consistent with previous estimates, but with a higher degree of certainty. The full-scale simulation presented here allows over 99 percent of the light distribution to be reasonably modeled.

Green, James↗

NASA NTRS1987

An overview of the extreme ultraviolet explorer and its scientific program

NASA's Extreme Ultraviolet Explorer (EUVE) will carry out an all-sky survey from 8 to 90 nm in four bandpasses; the limiting sensitivity will be between 2 to 3 orders of magnitude fainter than the hot white dwarf HZ 43. A deep survey will also be carried out along the ecliptic which will have a limiting sensitivity of 1 to 2 orders of magnitude fainter than the all-sky survey in the bandpass from 8 to 50 nm. The payload also includes a spectrometer which will be used to observe the brighter sources found in the surveys with a spectral resolution of 1 to 2 A.

Malina, Roger F.↗

NASA NTRS1987

Prospective EUV observations of hot DA white dwarfs with the EUV Explorer

The Extreme Ultraviolet Explorer (EUVE) will perform a high sensitivity EUV all-sky survey. A major category of sources which will be detected with the EUVE instruments consists of hot white dwarfs. Detailed preliminary studies of synthetic EUV observations of white dwarfs have been carried out using the predicted EUVE instrumental response functions. Using available information regarding space densities of white dwarfs and the distribution of neutral hydrogen in the interstellar medium, the numbers of DA white dwarfs which will be detectable in the different EUV bandpasses have been estimated.

Finley, David S.↗

NASA NTRS1986

An extreme ultraviolet telescope with no soft X-ray response

While EUV grazing incidence telescopes of conventional design exhibit a substantial X-ray response as well as an extreme UV response, and existing bandpass filters for the transmission of radiation longward of 400 A also transmit soft X-rays, the grazing incidence telescope presented suppresses this soft X-ray throughput through the incorporation of a Wolter Schwarzschild Type II mirror with large graze angles. The desirable features of an EUV photometric survey telescope are retained. An instrument of this design will be flown on the EUE mission, in order to make a survey of the sky at wavelengths longer than 400 A.

Finley, David S.↗

NASA NTRS1986

The mirrors for the Extreme Ultraviolet Explorer

Flight mirrors for the Extreme Ultraviolet Explorer satellite are currently under fabrication. The grazing incidence metal mirrors are Wolter-Schwarzschild Type I and II and are figured by diamond turning. Imaging performance is excellent, with the figure after polishing for the best mirror being such that the full width-half maximum is 1.0 arc seconds and the half energy width is 8 arc seconds measured at visible wavelengths. Surface finish, as determined from scattering measurements in the extreme ultraviolet, is about 20 A rms.

Finley, David S.↗

NASA NTRS1986

A Penning discharge source for extreme ultraviolet calibration

A Penning discharge lamp for use in the calibration of instruments and components for the extreme ultraviolet has been developed. This source is sufficiently light and compact to make it suitable for mounting on the movable slit assembly of a grazing incidence Rowland circle monochromator. Because this is a continuous discharge source, it is suitable for use with photon counting detectors. Line radiation is provided both by the gas and by atoms sputtered off the interchangeable metal cathodes. Usable lines are produced by species as highly ionized as Ne IV and Al V. The wavelength coverage provided is such that a good density of emission lines is available down to wavelengths as short as 100A. This source fills the gap between 100 and 300A, which is inadequately covered by the other available compact continuous radiation sources.

Finley, David S.↗

NASA NTRS1986

Optical surface evaluation by soft X-ray scattering

During the fabrication of the mirrors for the Extreme Ultraviolet Explorer (EUVE), methods for evaluating the surface quality of the optics have been developed. Measurement of soft X-ray scattering profiles allows for the determination of the surface roughness and correlation lengths for highly polished metal surfaces. With this method, the surface parameters for one of the Wolter Schwarzschild type I mirrors that had been fabricated for the EUVE mission have been determined. The techniques employed, the theoretical basis for the method, and the data that had been taken are presented. The measurements show that the best mirrors have a surface roughness of 20A rms or less.

Green, James C.↗