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Fischer, David J.

Publications and source records attributed to Fischer, David J..

4 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2012

Wavefront Calibration Testing of the James Webb Space Telescope Primary Mirror Center of Curvature Optical Assembly

The James Webb Space Telescope (JWST) Optical Telescope Element (OTE) consists of a 6.6 meter clear aperture, all-reflective, three-mirror anastigmat!. The 18-segment primary mirror (PM) presents unique and challenging assembly, integration, alignment and testing requirements. A full aperture center of curvature optical test is performed in cryogenic vacuum conditions at the integrated observatory level to verify PM performance requirements. Two wavefront calibration tests are utilized to verify the low and Mid/High spatial frequency performance ofthe test system. In this paper the methods and results of the wavefront calibration tests are presented.

Olczak, Gene↗
NASA NTRS2011

James Webb Space Telescope Primary Mirror Integration: Testing the Multiwavelength Interferometer on the Test Bed Telescope

The James Webb Space Telescope (JWST) integration includes a center of curvature test on its 18 primary mirror segment assemblies (PMSAs). This important test is the only ground test that will demonstrate the ability to align all 18 PMSAs. Using a multi-wavelength interferometer (MWIF) integrated to the test bed telescope (TBT), a one-sixth scale model of the JWST, we verify our ability to align and phase the 18 PMSAs. In this paper we will discuss data analysis and test results when using the MWIF to align the segments of the TBT in preparation for alignment of the JWST.

Olczak, Gene↗
NASA NTRS1993

Vector formulation for interferogram surface fitting

Interferometry is an optical testing technique that quantifies the optical path difference (OPD) between a reference wave front and a test wave front based on the interference of light. Fringes are formed when the OPD is an integral multiple of the illuminating wavelength. The resultant two-dimensional pattern is called an interferogram. The function of any interferogram analysis program is to extract this OPD and to produce a representation of the test wave front (or surface). This is accomplished through a three-step process of sampling, ordering, and fitting. We develop a generalized linear-algebra vector-notation model of the interferogram sampling and fitting process.

Fischer, David J.↗