Intragrain charge transport in kesterite thin films—Limits arising from carrier localization
Intragrain charge carrier mobilities measured by time-resolved terahertz spectroscopy in state of the art Cu 2 ZnSn(S,Se) 4 kesterite thin films are found to increase from 32 to 140 cm 2 V -1 s -1 with increasing Se content. The mobilities are limited by carrier localization on the nanometer-scale, which takes place within the first 2 ps after carrier excitation. The localization strength obtained from the Drude-Smith model is found to be independent of the excited photocarrier density. This is in accordance with bandgap fluctuations as a cause of the localized transport. Lastly, charge carrier localization is a general issue in the probed kesterite thin films, which were deposited by coevaporation, colloidal inks, and sputtering followed by annealing with varying Se/S contents and yield 4.9%-10.0% efficiency in the completed device.