Engineering topics
Folkman, C. M.
Publications and source records attributed to Folkman, C. M..
Magnetic field tuned superconductor-to-insulator transition at the LaAlO 3 / SrTiO 3 interface
Not Available
Coherent Bragg Nanodiffraction at the Hard X-ray Nanoprobe Beamline
Abstract not provided
Surface diffraction on a psic diffractometer using the {chi}-axis geometry
Abstract not provided
Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography
Not Available
Modular instrument mounting system for variable environment in operando X-ray experiments
In the growing field of in operando and in situ X-ray experiments, there exists a large disparity in the types of environments and equipment to control them. This situation makes it challenging to conduct multiple experiments with a single mechanical interface to the diffractometer. Here, we describe the design and implementation of a modular instrument mounting system that can be installed on a standard six-circle diffractometer (e.g., 5021 Huber GmbH). This new system allows for the rapid changeover of different chambers and sample heaters and permits accurate sample positioning (x, y, z, and azimuthal rotation) without rigid coupling to the chamber body. Isolation of the sample motion from the chamber enclosure is accomplished through a combination of custom rotary seals and bellows. Control of the pressure and temperature has been demonstrated in the ranges of 10{sup -6}-10{sup 3} Torr and 25 Degree-Sign C-900 Degree-Sign C, respectively. We have utilized the system with several different modular instruments. As an example, we provide in situ sputtering results, where the growth dynamics of epitaxial LaGaO{sub 3} thin films on (001) SrTiO{sub 3} substrates were investigated.