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Frederickson, A. R.

Publications and source records attributed to Frederickson, A. R..

At least 19 records

Mining CRRES IDM Pulse Data and CRRES Environmental Data to Improve Spacecraft Charging/Discharging Models and Guidelines

One can truly predict the charging and pulsing in space over a year's time using only the physics that worked for periods of an hour and less in prior publications. All portions of the task were achieved, including the optional portion of determining a value for conductivity that best .t the data. Fortran statements were developed that are required for the NUMIT runs to work with this kind of data from space. In addition to developing the Fortran for NUMIT, simple correlations between the IDM pulsing history and the space radiation were observed because we now have a better characterization of the space radiation. The study showed that: (1) the new methods for measurement of charge storage and conduction in insulators provide the correct values to use for prediction of charging and pulsing in space; (2) the methods in NUMIT that worked well for time durations less than hours now work well for durations of months; (3) an average spectrum such as AE8 is probably not a good guide for predicting pulsing in space one must take time dependence into account in order to understand insulator pulsing; and (4) the old method for predicting pulse rates in space that was based on the CRRES data could be improved to include dependencies on material parameters.

Brautigam, D. H.

Comparison of Classical and Charge Storage Methods for Determining Conductivity of Thin Film Insulators

Conductivity of insulating materials is a key parameter to determine how accumulated charge will distribute across the spacecraft and how rapidly charge imbalance will dissipate. Classical ASTM and IEC methods to measure thin film insulator conductivity apply a constant voltage to two electrodes around the sample and measure the resulting current for tens of minutes. However, conductivity is more appropriately measured for spacecraft charging applications as the "decay" of charge deposited on the surface of an insulator. Charge decay methods expose one side of the insulator in vacuum to sequences of charged particles, light, and plasma, with a metal electrode attached to the other side of the insulator. Data are obtained by capacitive coupling to measure both the resulting voltage on the open surface and emission of electrons from the exposed surface, as well monitoring currents to the electrode. Instrumentation for both classical and charge storage decay methods has been developed and tested at Jet Propulsion Laboratory (JPL) and at Utah State University (USU). Details of the apparatus, test methods and data analysis are given here. The JPL charge storage decay chamber is a first-generation instrument, designed to make detailed measurements on only three to five samples at a time. Because samples must typically be tested for over a month, a second-generation high sample throughput charge storage decay chamber was developed at USU with the capability of testing up to 32 samples simultaneously. Details are provided about the instrumentation to measure surface charge and current; for charge deposition apparatus and control; the sample holders to properly isolate the mounted samples; the sample carousel to rotate samples into place; the control of the sample environment including sample vacuum, ambient gas, and sample temperature; and the computer control and data acquisition systems. Measurements are compared here for a number of thin film insulators using both methods at both facilities. We have found that conductivity determined from charge storage decay methods is 102 to 104 larger than values obtained from classical methods. Another Spacecraft Charging Conference presentation describes more extensive measurements made with these apparatus. This work is supported through funding from the NASA Space Environments and Effects Program and the USU Space Dynamics Laboratory Enabling Technologies Program.

Swaminathan, Prasanna

Charge Storage, Conductivity and Charge Profiles of Insulators as Related to Spacecraft Charging

Dissipation of charges built up near the surface of insulators due to space environment interaction is central to understanding spacecraft charging. Conductivity of insulating materials is key to determine how accumulated charge will distribute across the spacecraft and how rapidly charge imbalance will dissipate. To understand these processes requires knowledge of how charge is deposited within the insulator, the mechanisms for charge trapping and charge transport within the insulator, and how the profile of trapped charge affects the transport and emission of charges from insulators. One must consider generation of mobile electrons and holes, their trapping, thermal de-trapping, mobility and recombination. Conductivity is more appropriately measured for spacecraft charging applications as the "decay" of charge deposited on the surface of an insulator, rather than by flow of current across two electrodes around the sample. We have found that conductivity determined from charge storage decay methods is 102 to 104 smaller than values obtained from classical ASTM and IEC methods for a variety of thin film insulating samples. For typical spacecraft charging conditions, classical conductivity predicts decay times on the order of minutes to hours (less than typical orbit periods); however, the higher charge storage conductivities predict decay times on the order of weeks to months leading to accumulation of charge with subsequent orbits. We found experimental evidence that penetration profiles of radiation and light are exceedingly important, and that internal electric fields due to charge profiles and high-field conduction by trapped electrons must be considered for space applications. We have also studied whether the decay constants depend on incident voltage and flux or on internal charge distributions and electric fields; light-activated discharge of surface charge to distinguish among differing charge trapping centers; and radiation-induced conductivity. Our experiments also show that "Malter" electron emission occurs for hours after turning off the electron beam. This Malter emission similar to emission due to negative electron affinity in semiconductors is a result of the prior radiation or optical excitations of valence electrons and their slow drift among traps towards the surface where they are subsequently emitted. This work is supported through funding from the NASA Space Environments and Effects Program.

Dennison, J. R.

The radiation effects on Galileo spacecraft systems at Jupiter

The Galileo spacecraft has been subjected to the charged particle environment around Jupiter since 1995. There have been numerous system failures attributable to radiation effects. We summarize those failures, their causes and any associated fixes.

Galileo

Electrostatic Discharge Induced in Packaging by Space Radiation

Radiation belts around Planets have sufficient high energy electron flux to penetrate spacecraft skins and statically charge insulators inside the electronic boxes. For example, geosynchronous-orbit Earth spacecraft require 100 mils aluminum shielding to sufficiently attenuate the fast electron flux. Electrons are stopped and accumulate slowly in the insulated materials to produce strong electric fields. Typically the field strength achieves a threshold for occasional spontaneous discharge in the insulating material. The field strength remains high yet pulsing is infrequent. Charge can leak off if the insulator is sufficiently leaky. The conductivity of insulators is usually controlled by mobile ions such as H and OH in ground service. In space the mobile ions are eventually out-gassed. The resistivity of several insulators is known to increase over three decades after exposure to vacuum for several months. Insulators in space were seen to pulse more frequently as they aged.

Frederickson, A. R.

The CRRES IDM spacecraft experiment for insulator discharge pulses

The Internal Discharge Monitor (IDM) is designed to observe electrical pulses from common electrical insulators in space service. The characteristics of the instrument are described. The IDM was flown on the Combined Release and Radiation Effects Satellite (CRRES). The sixteen insulator samples included G10 circuit boards, FR4 and PTFE fiberglass circuit boards, FEP Teflon, alumina, and wires with common insulations. The samples are fully enclosed, mutually isolated, and space radiation penetrates 0.02 cm of aluminum before striking the samples. Published data in the literature provides a simple method for determining the flux of penetrating electrons. The pulse rate is compared to the penetrating flux of electrons.

Frederickson, A. R.

Radiation-induced insulator discharge pulses in the CRRES internal discharge monitor satellite experiment

The Internal Discharge Monitor (IDM) was designed to observe electrical pulses from common electrical insulators in space service. The sixteen insulator samples included twelve planar printed circuit boards and four cables. The samples were fully enclosed, mutually isolated, and space radiation penetrated 0.02 cm of aluminum before striking the samples. Pulsing began on the seventh orbit, the maximum pulse rate occurred on the seventeenth orbit when 13 pulses occurred, and the pulses slowly diminished to about one per 3 orbits six months later. After 8 months, the radiation belts abruptly increased and the pulse rates attained a new high. These pulse rates were in agreement with laboratory experience on shorter time scales. Several of the samples never pulsed. If the pulses were not confined within IDM, the physical processes could spread to become a full spacecraft anomaly. The IDM results indicate the rate at which small insulator pulses occur. Small pulses are the seeds of larger satellite electrical anomalies. The pulse rates are compared with space radiation intensities, L shell location, and spectral distributions from the radiation spectrometers on the Combined Release and Radiation Effects Satellite.

Frederickson, A. R.

Patterns of discoloration and oxidation by direct and scattered fluxes on LDEF, including oxygen on silicon

A number of interesting discoloration patterns are clearly evident on MOOO2-1 which resides on the three faces of the Long Duration Exposure Facility (LDEF). Most interesting is the pattern of blue oxidation on polished single crystal silicon apparently produced by scattered or direct ram oxygen atoms along the earth face. A complete explanation for the patterns has not yet been obtained. All honeycomb outgassing holes have a small discoloration ring around them that varies in color. The shadow cast by a suspended wire on the earth face surface is not easily explained by either solar photons or by ram flux. The shadows and the dark/light regions cannot be explained consistently by the process of solar ultraviolet paint-darkening modulated by ram flux oxygen bleaching of the paint.

Frederickson, A. R.

Quantitative ESD Guidelines for Charged Spacecraft Derived from the Physics of Discharges

Quantitative guidelines are proposed for Electrostatic Discharge (ESD) pulse shape on charged spacecraft. The guidelines are based on existing ground test data, and on a physical description of the pulsed discharge process. The guidelines are designed to predict pulse shape for surface charging and internal charging on a wide variety of spacecraft structures. The pulses depend on the area of the sample, its capacitance to ground, and the strength of the electric field in the vacuum adjacent to the charged surface. By knowing the pulse shape, current vs. time, one can determine if nearby circuits are threatened by the pulse. The quantitative guidelines might be used to estimate the level of threat to an existing spacecraft, or to redesign a spacecraft to reduce its pulses to a known safe level. The experiments which provide the data and the physics that allow one to interpret the data will be discussed, culminating in examples of how to predict pulse shape/size. This method has been used, but not confirmed, on several spacecraft.

Frederickson, A. R.