Engineering topics

Frenzel, James F.

Publications and source records attributed to Frenzel, James F..

5 records

NASA NTRS1993

Test pattern generation for ILA sequential circuits

An efficient method of generating test patterns for sequential machines implemented using one-dimensional, unilateral, iterative logic arrays (ILA's) of BTS pass transistor networks is presented. Based on a transistor level fault model, the method affords a unique opportunity for real-time fault detection with improved fault coverage. The resulting test sets are shown to be equivalent to those obtained using conventional gate level models, thus eliminating the need for additional test patterns. The proposed method advances the simplicity and ease of the test pattern generation for a special class of sequential circuitry.

Feng, YU↗

NASA NTRS1993

Detection of CMOS bridging faults using minimal stuck-at fault test sets

The performance of minimal stuck-at fault test sets at detecting bridging faults are evaluated. New functional models of circuit primitives are presented which allow accurate representation of bridging faults under switch-level simulation. The effectiveness of the patterns is evaluated using both voltage and current testing.

Ijaz, Nabeel↗

NASA NTRS1993

Design methods for fault-tolerant finite state machines

VLSI electronic circuits are increasingly being used in space-borne applications where high levels of radiation may induce faults, known as single event upsets. In this paper we review the classical methods of designing fault tolerant digital systems, with an emphasis on those methods which are particularly suitable for VLSI-implementation of finite state machines. Four methods are presented and will be compared in terms of design complexity, circuit size, and estimated circuit delay.

Niranjan, Shailesh↗

NASA NTRS1992

Defect-sensitivity analysis of an SEU immune CMOS logic family

Fault testing of resistive manufacturing defects is done on a recently developed single event upset immune logic family. Resistive ranges and delay times are compared with those of traditional CMOS logic. Reaction of the logic to these defects is observed for a NOR gate, and an evaluation of its ability to cope with them is determined.

Ingermann, Erik H.↗

NASA NTRS1992

A set-associative, fault-tolerant cache design

The design of a defect-tolerant control circuit for a set-associative cache memory is presented. The circuit maintains the stack ordering necessary for implementing the Least Recently Used (LRU) replacement algorithm. A discussion of programming techniques for bypassing defective blocks is included.

Lamet, Dan↗