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Garvin, H. L.

Publications and source records attributed to Garvin, H. L..

10 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

Multilayer Badges Indicate Depths Of Ion Sputter Etches

Multilayer badges devised to provide rapid, in-place indications of ion sputter etch rates. Badges conceived for use in estimating ion erosion of molybdenum electrodes used in inert-gas ion thrustors. Concept adapted to measure ion erosion in industrial sputter etching processes used for manufacturing of magnetic, electronic, and optical devices. Badge etched when bombarded by energetic ions. Badge layers exposed using mask. Contrast between layers facilitates counting of layers to determine etch depth.

Beattie, J. R.↗
NASA NTRS1982

A direct-measurement technique for estimating discharge-chamber lifetime

The use of short-term measurement techniques for predicting the wearout of ion thrusters resulting from sputter-erosion damage is investigated. The laminar-thin-film technique is found to provide high precision erosion-rate data, although the erosion rates are generally substantially higher than those found during long-term erosion tests, so that the results must be interpreted in a relative sense. A technique for obtaining absolute measurements is developed using a masked-substrate arrangement. This new technique provides a means for estimating the lifetimes of critical discharge-chamber components based on direct measurements of sputter-erosion depths obtained during short-duration (approximately 1 hr) tests. Results obtained using the direct-measurement technique are shown to agree with sputter-erosion depths calculated for the plasma conditions of the test. The direct-measurement approach is found to be applicable to both mercury and argon discharge-plasma environments and will be useful for estimating the lifetimes of inert gas and extended performance mercury ion thrusters currently under development.

Beattie, J. R.↗
NASA NTRS1980

Grid polarizers for infrared Fourier spectrometers

Infrared grid polarizers consisting of copper lines with a 3.6-micron grid constant on a 4-micron-thick Mylar polyester substrate have been prepared by the techniques of photolithography and sputter-etching. Their polarization properties have been measured and found to be suitable for use at infrared frequencies below 700/cm. The polarizers have been used to extend the useful frequency range of a Martin-Puplett polarizing interferometer designed for Fourier transform spectroscopy. The efficiency of the interferometer has been measured over a frequency range from 50 to 700/cm and compared to that of a conventional Michelson interferometer. The results are shown to be consistent with the measured properties of the polarizers. Methods are suggested for improving the efficiency of a Martin-Puplett interferometer which employs these polarizers.

Challener, W. A.↗
NASA NTRS1967

Ion beam sputtering of liquid metals.

Sputtering yields and energy-transfer efficiency measurements by ion beam sputtering of liquid metals indicate no justification for incorporation into low thrustor

METAL PARTICLE↗